Jurriaan Schmitz

12 papers Journal 6Unranked 6
YearRankTypeTitle / Venue / Authors
2023 — conf
Characterisation of Photodiodes in 22 nm FDSOI at 850 nm.
ESSDERC
Jelle H. T. Bakker, Mark S. Oude Alink, Jurriaan Schmitz, Bram Nauta
2020 — conf
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices.
IRPS
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
2018 J jnl
Towards understanding recovery of hot-carrier induced degradation.
Microelectron. Reliab.
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
2017 J jnl
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs.
Microelectron. Reliab.
Maurits J. de Jong, Cora Salm, Jurriaan Schmitz
2014 — conf
Identifying failure mechanisms in LDMOS transistors by analytical stability analysis.
ESSDERC
Alessandro Ferrara, Peter G. Steeneken, Boni K. Boksteen, Anco Heringa, Andries J. Scholten, Jurriaan Schmitz, Raymond J. E. Hueting
2014 — conf
Silicon LEDs in FinFET technology.
ESSDERC
Giulia Piccolo, Piet I. Kuindersma, Lars-Åke Ragnarsson, Raymond J. E. Hueting, Nadine Collaert, Jurriaan Schmitz
2013 — conf
Role of junction depth in light emission from silicon p-i-n leds.
ESSDERC
Giulia Piccolo, Amir Sammak, Raymond J. E. Hueting, Jurriaan Schmitz, Lis K. Nanver
2012 — conf
Micro- and nano-link ultra-low power heaters for sensors.
ESSDERC
Alfons W. Groenland, Elizaveta Vereshchagina, Alexey Y. Kovalgin, Rob A. M. Wolters, J. G. E. Gardeniers, Jurriaan Schmitz
2008 J jnl
RF CMOS reliability simulations.
Microelectron. Reliab.
Guido T. Sasse, Mustafa Acar, Fred G. Kuper, Jurriaan Schmitz
2008 J jnl
Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip.
Microelectron. Reliab.
Cora Salm, Victor M. Blanco Carballo, Joost Melai, Jurriaan Schmitz
2007 J jnl
Low-frequency noise in hot-carrier degraded nMOSFETs.
Microelectron. Reliab.
Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz
2006 J jnl
Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs.
Microelectron. Reliab.
Cora Salm, André J. Hof, Fred G. Kuper, Jurriaan Schmitz