Juraj Brenkus

15 papers C 11Journal 4
YearRankTypeTitle / Venue / Authors
2019 C conf
High side power MOSFET switch driver for a low-power AC/DC converter.
DDECS
Miroslav Potocný, Juraj Brenkus, Viera Stopjaková
2017 J jnl
A Novel Method Towards Time-Efficient Fault Analysis of Analog and Mixed-Signal Circuits.
J. Circuits Syst. Comput.
Juraj Brenkus, Viera Stopjaková, Viera Cernanová, Daniel Arbet, Lukás Nagy, Vladimír Sedlák
2016 C conf
Impedance calculation based method for AC fault analysis of mixed-signal circuits.
DDECS
Juraj Brenkus, Viera Stopjaková, Lukás Nagy, Daniel Arbet
2016 C conf
Low-voltage bulk-driven variable gain amplifier in 130 nm CMOS technology.
DDECS
Daniel Arbet, Martin Kovác, Lukás Nagy, Viera Stopjaková, Juraj Brenkus
2014 J jnl
A new I
Microprocess. Microsystems
Gábor Gyepes, Viera Stopjaková, Daniel Arbet, Libor Majer, Juraj Brenkus
2014 C conf
A novel impedance calculation method and its time efficiency evaluation.
DDECS
Juraj Brenkus, Viera Stopjaková, Daniel Arbet, Gábor Gyepes, Libor Majer
2014 J jnl
BIST architecture for oscillation test of analog ICs and investigation of test hardware influence.
Microelectron. Reliab.
Daniel Arbet, Viera Stopjaková, Juraj Brenkus, Gábor Gyepes, Martin Kovác, Libor Majer
2014 J jnl
Current Sensing Completion Detection in Single-Rail Asynchronous Systems.
Comput. Informatics
Lukás Nagy, Viera Stopjaková, Juraj Brenkus
2013 C conf
Numerical method for DC fault analysis simplification and simulation time reduction.
DDECS
Juraj Brenkus, Viera Stopjaková, Gábor Gyepes
2012 C conf
Application of IDDT test towards increasing SRAM reliability in nanometer technologies.
DDECS
Gábor Gyepes, Daniel Arbet, Juraj Brenkus, Viera Stopjaková
2012 C conf
OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters.
DDECS
Daniel Arbet, Gábor Gyepes, Juraj Brenkus, Viera Stopjaková
2011 C conf
Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies.
DDECS
Gábor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjaková
2011 C conf
Increasing the efficiency of analog OBIST using on-chip compensation of technology variations.
DDECS
Daniel Arbet, Juraj Brenkus, Gábor Gyepes, Viera Stopjaková
2009 C conf
Comparison of different test strategies on a mixed-signal circuit.
DDECS
Juraj Brenkus, Viera Stopjaková, Ronny Vanhooren, Anton Chichkov
2008 C conf
Experimental Analog Circuit for Parametric Test Methods Efficiency Evaluation.
DDECS
Juraj Brenkus, Viera Stopjaková, Jozef Mihálov