| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Microelectron. J.
|
| 2025 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2023 | J | jnl |
IEEE J. Solid State Circuits
|
| 2023 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2022 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2022 | J | jnl |
Int. J. Inf. Commun. Technol.
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | J | jnl |
IEEE J. Solid State Circuits
|
| 2021 | J | jnl |
IEEE J. Solid State Circuits
|
| 2020 | J | jnl |
IEEE Trans. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | J | jnl |
A dual-output hardening design of inverter chain for P-hit single-event transient pulse elimination.
IEICE Electron. Express
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | J | jnl |
Comput. Biol. Chem.
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
IEEE J. Solid State Circuits
|
| 2016 | J | jnl |
IEICE Electron. Express
|
| 2015 | J | jnl |
IEICE Electron. Express
|
| 2015 | J | jnl |
IEICE Electron. Express
|
| 2015 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2013 | J | jnl |
Sensors
|
| 2006 | — | conf |
APCCAS
|
| 2006 | — | conf |
APCCAS
|