| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2026 | J | jnl |
Pattern Recognit.
|
| 2026 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2025 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2025 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2025 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2024 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2024 | — | conf |
EMBC
|
| 2023 | J | jnl |
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
|
| 2023 | J | jnl |
Proc. ACM Manag. Data
|
| 2023 | — | conf |
CCL
|
| 2023 | — | conf |
ACPR (1)
|
| 2022 | B | conf |
LREC
|
| 2022 | J | jnl |
CoRR
|
| 2020 | J | jnl |
IEEE Access
|
| 2014 | J | jnl |
J. Sensors
|