| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2025 | — | conf |
CICC
|
| 2025 | C | conf |
ISCAS
|
| 2025 | C | conf |
ISCAS
|
| 2025 | Misc | conf |
ICASSP
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Commun. Lett.
|
| 2025 | B | conf |
TrustCom
|
| 2025 | J | jnl |
CoRR
|
| 2025 | B | conf |
SMC
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Wirel. Commun.
|
| 2025 | Misc | conf |
ICASSP
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
To NFT or Not: A Strategic Analysis for Fashion Brands Developing Digital Products in the Metaverse.
J. Theor. Appl. Electron. Commer. Res.
|
| 2025 | J | jnl |
J. Frankl. Inst.
|
| 2025 | — | conf |
ICC
|
| 2024 | C | conf |
ISCAS
|
| 2024 | C | conf |
ISCAS
|
| 2024 | C | conf |
ISCAS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | C | conf |
ISCAS
|
| 2024 | — | conf |
PRCV (5)
|
| 2024 | C | conf |
INDIN
|
| 2024 | C | conf |
INDIN
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | C | conf |
INDIN
|
| 2024 | J | jnl |
Expert Syst. J. Knowl. Eng.
|
| 2024 | C | conf |
INDIN
|
| 2024 | J | jnl |
Syst.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | A | conf |
ICWS
|
| 2023 | C | conf |
ISCAS
|
| 2023 | Misc | conf |
ICASSP
|
| 2023 | J | jnl |
BMC Medical Imaging
|
| 2022 | J | jnl |
RAIRO Oper. Res.
|
| 2022 | J | jnl |
Biomed. Signal Process. Control.
|
| 2022 | — | conf |
IWSLT@ACL
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
CoRR
|
| 2019 | — | conf |
AIAM (ACM)
|
| 2018 | J | jnl |
J. Signal Process. Syst.
|
| 2018 | — | conf |
IWSLT
|
| 2018 | J | jnl |
CoRR
|
| 2017 | — | conf |
Computer-Aided Diagnosis
|
| 2016 | — | conf |
Cluster-based senone selection for the efficient calculation of deep neural network acoustic models.
ISCSLP
|
| 2016 | — | conf |
SmartCom
|
| 2016 | A | conf |
INTERSPEECH
|
| 2014 | — | conf |
CCTA
|
| 2014 | — | conf |
I2MTC
|
| 2012 | — | conf |
CCTA (2)
|
| 2010 | — | conf |
NEMS
|
| 2010 | — | conf |
MVHI
|
| 2007 | — | conf |
ICNC (2)
|
| 2006 | — | conf |
ISNN (2)
|
| 2005 | J | jnl |
Microelectron. Reliab.
|