Jun Matsushima

18 papers A 1B 1Misc 1Journal 6Unranked 9
YearRankTypeTitle / Venue / Authors
2026 J jnl
Transfer Learning With U-Swin Transformer for Adaptive Ground Roll Attenuation in Seismic Records From Sabkha Environments.
IEEE Access
Ahmed Eleslambouly, Guibin Zhao, Fateh Bouchaala, Mohammed Y. Ali, Jun Matsushima
2023 A conf
A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy.
ITC
Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Oussama Laouamri, Naveen Khanna, Jeff Mayer, Nilanjan Mukherjee
2023 J jnl
Test Point Insertion for Multi-Cycle Power-On Self-Test.
ACM Trans. Design Autom. Electr. Syst.
Senling Wang, Xihong Zhou, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima
2021 — conf
A Power Reduction Method for Scan Testing in Ultra-Low Power Designs.
ATS
Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima
2020 J jnl
FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST.
IEICE Trans. Inf. Syst.
Hanan T. Al-Awadhi, Tomoki Aono, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima
2018 J jnl
Automotive Functional Safety Assurance by POST with Sequential Observation.
IEEE Des. Test
Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Jun Matsushima
2018 — conf
Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.
ATS
Senling Wang, Tomoki Aono, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima
2018 B conf
Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262.
ETS
Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima
2018 Misc conf
Innovative practices on test in Japan.
VTS
Koji Asami, Yoshiro Tamura, Haruo Kobayashi, Jun Matsushima, Yoichi Maeda, Kazumi Hatayama
2017 J jnl
A 16 nm FinFET Heterogeneous Nona-Core SoC Supporting ISO26262 ASIL B Standard.
IEEE J. Solid State Circuits
Shinichi Shibahara, Chikafumi Takahashi, Kazuki Fukuoka, Yuko Kitaji, Takahiro Irita, Hirotaka Hara, Yasuhisa Shimazaki, Jun Matsushima
2017 — conf
Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test.
ATS
Yoichi Maeda, Jun Matsushima, Ron Press
2016 — conf
4.5 A 16nm FinFET heterogeneous nona-core SoC complying with ISO26262 ASIL-B: Achieving 10-7 random hardware failures per hour reliability.
ISSCC
Chikafumi Takahashi, Shinichi Shibahara, Kazuki Fukuoka, Jun Matsushima, Yuko Kitaji, Yasuhisa Shimazaki, Hirotaka Hara, Takahiro Irita
2016 — conf
Multi-configuration Scan Structure for Various Purposes.
ATS
Hiroyuki Iwata, Jun Matsushima
2016 — conf
Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation.
ATS
Senling Wang, Hanan T. Al-Awadhi, Soh Hamada, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Jun Matsushima
2012 J jnl
A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule.
ACM Trans. Design Autom. Electr. Syst.
Masanori Kurimoto, Jun Matsushima, Shigeki Ohbayashi, Yoshiaki Fukui, Michio Komoda, Nobuhiro Tsuda
2012 — conf
An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms.
Asian Test Symposium
Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Masahiro Takakura
2010 — conf
A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule.
ISQED
Masanori Kurimoto, Jun Matsushima, Shigeki Ohbayashi, Yoshiaki Fukui
2008 — conf
CooLBIST: An Effective Approach of Test Power Reduction for LBIST.
ATS
Jun Matsushima, Yoichi Maeda, Masahiro Takakura