Jun-Sik Yoon

16 papers A 1Journal 13Unranked 2
YearRankTypeTitle / Venue / Authors
2025 — conf
Novel Approach to Acute Heart Failure Risk Stratification Using AI-Derived Congestion Index from Chest Radiographs and Clinical Parameter.
MedInfo
Ki-Hyun Jeon, Taeho Hur, Minjae Yoon, Hyoung-Won Cho, Eun Ju Chun, Jong-Min Kim, Jun-Sik Yoon, Dain Lee, Sang Joon Park, Dong-Ju Choi
2025 — conf
Placement-Aware 3D Net-to-Pad Assignment for Array-Style Hybrid Bonding 3D ICs.
ISPD
Pruek Vanna-Iampikul, Jun-Sik Yoon, Chaeryung Park, Gary Yeap, Sung Kyu Lim
2023 A conf
A Comparative Study on Front-Side, Buried and Back-Side Power Rail Topologies in 3nm Technology Node.
ISLPED
Sandra Maria Shaji, Lingjun Zhu, Jun-Sik Yoon, Sung Kyu Lim
2023 J jnl
Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning.
IEEE Access
Kihoon Nam, Chanyang Park, Hyeok Yun, Jun-Sik Yoon, Hyundong Jang, Kyeongrae Cho, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek
2022 J jnl
DC Performance Variations by Grain Boundary in Source/Drain Epitaxy of Sub-3-nm Nanosheet Field-Effect Transistors.
IEEE Access
Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Junjong Lee, Sanguk Lee, Jaewan Lim, Rock-Hyun Baek
2022 J jnl
Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm.
IEEE Access
Hyundong Jang, Hyeok Yun, Chanyang Park, Kyeongrae Cho, Kihoon Nam, Jun-Sik Yoon, Hyun-Chul Choi, Rock-Hyun Baek
2021 J jnl
Analysis of TSV-Induced Mechanical Stress and Electrical Noise Coupling in Sub 5-nm Node Nanosheet FETs for Heterogeneous 3D-ICs.
IEEE Access
Jinsu Jeong, Jun-Sik Yoon, Rock-Hyun Baek
2021 J jnl
Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning.
IEEE Access
Jun-Sik Yoon, Seunghwan Lee, Hyeok Yun, Rock-Hyun Baek
2021 J jnl
Monolithic 3D 6T-SRAM Based on Newly Designed Gate and Source/Drain Bottom Contact Schemes.
IEEE Access
Junjong Lee, Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Sanguk Lee, Rock-Hyun Baek
2020 J jnl
A Novel Sub-5-nm Node Dual-Workfunction Folded Cascode Nanosheet FETs for Low Power Mobile Applications.
IEEE Access
Jun-Sik Yoon, Rock-Hyun Baek
2020 J jnl
Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application.
IEEE Access
Jinsu Jeong, Jun-Sik Yoon, Seunghwan Lee, Rock-Hyun Baek
2020 J jnl
Device Design Guideline of 5-nm-Node FinFETs and Nanosheet FETs for Analog/RF Applications.
IEEE Access
Jun-Sik Yoon, Rock-Hyun Baek
2020 J jnl
Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing.
IEEE Access
Hyun-Chul Choi, Hyeok Yun, Jun-Sik Yoon, Rock-Hyun Baek
2019 J jnl
Bottom Oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node.
IEEE Access
Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Rock-Hyun Baek
2019 J jnl
Punch-Through-Stopper Free Nanosheet FETs With Crescent Inner-Spacer and Isolated Source/Drain.
IEEE Access
Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee, Rock-Hyun Baek
2019 J jnl
Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node.
IEEE Access
Jun-Sik Yoon, Seunghwan Lee, Junjong Lee, Jinsu Jeong, Hyeok Yun, Bohyeon Kang, Rock-Hyun Baek