Juin J. Liou

60 papers A 1C 1Misc 2Journal 51Unranked 5
YearRankTypeTitle / Venue / Authors
2026 J jnl
A Review of Bandwidth Enhancement Techniques for Die-to-Die Single-Ended Interfaces in Chiplets.
IEEE Access
Haitao You, Yixiang Chen, Li Zhang, Xiaofang Gao, Xinyu Wu, Tianyi Zhang, Shizeng Zhang, Dimitar Nikolov, Qiang Cui, Juin J. Liou
2019 J jnl
Digital Volume Pulse Measured at the Fingertip as an Indicator of Diabetic Peripheral Neuropathy in the Aged and Diabetic.
Entropy
Hai-Cheng Wei, Na Ta, Wen-Rui Hu, Ming-Xia Xiao, Xiao-Jing Tang, Bagus Haryadi, Juin J. Liou, Hsien-Tsai Wu
2018 J jnl
A double snapback SCR ESD protection scheme for 28 nm CMOS process.
Microelectron. Reliab.
Tao Hu, Shurong Dong, Hao Jin, Hei Wong, Zekun Xu, Xiang Li, Juin J. Liou
2018 J jnl
Application of multiscale Poincaré short-time computation versus multiscale entropy in analyzing fingertip photoplethysmogram amplitudes to differentiate diabetic from non-diabetic subjects.
Comput. Methods Programs Biomed.
Bagus Haryadi, Juin J. Liou, Hai-Cheng Wei, Ming-Xia Xiao, Hsien-Tsai Wu, Cheuk-Kwan Sun
2018 J jnl
Editorial: IEDMS 2016.
Microelectron. Reliab.
Chuan-Hsi Liu, Chun-Hu Cheng, Chin-Pao Cheng, Juin J. Liou
2018 J jnl
Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process.
Microelectron. J.
Zhaonian Yang, Yuan Yang, Ningmei Yu, Juin J. Liou
2017 J jnl
A novel vertical SCR for ESD protection in 40 V HV bipolar process.
Microelectron. Reliab.
Fan Liu, Zhiwei Liu, Jizhi Liu, Cheng Hui, Zhao Liu, Tian Rui, Shiyu Song, Juin J. Liou
2017 J jnl
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez
2017 J jnl
ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications.
Microelectron. Reliab.
Aihua Dong, Javier A. Salcedo, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Sirui Luo, Jean-Jacques Hajjar, Juin J. Liou
2017 — conf
Tutorial sessions: Electrostatic discharge protection of consumer electronics: Challenges and solutions.
ASICON
Juin J. Liou
2016 J jnl
Characteristics of ESD protection devices operated under elevated temperatures.
Microelectron. Reliab.
Wei Liang, Aihua Dong, Hang Li, Meng Miao, Chung-Chen Kuo, Maxim Klebanov, Juin J. Liou
2016 J jnl
Very small snapback silicon-controlled rectifier for electrostatic discharge protection in 28 nm processing.
Microelectron. Reliab.
Weihuai Wang, Hao Jin, Wei Guo, Shurong Dong, Wei Liang, Juin J. Liou, Yan Han
2015 J jnl
A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction.
Microelectron. Reliab.
Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Juan Muci, Andrea Sucre-González, Juin J. Liou
2015 J jnl
Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation.
Microelectron. Reliab.
Meng Miao, Yuanzhong Paul Zhou, Javier A. Salcedo, Jean-Jacques Hajjar, Juin J. Liou
2015 J jnl
Design and characterization of ESD solutions with EMC robustness for automotive applications.
Microelectron. Reliab.
Yunfeng Xi, Javier A. Salcedo, Yuanzhong Paul Zhou, Juin J. Liou, Jean-Jacques Hajjar
2015 J jnl
Editorial.
Microelectron. Reliab.
Juin J. Liou, Chun-Chieh Lin, Chu-Hsuan Lin
2015 J jnl
Total ionizing dose sensitivity of function blocks in FRAM.
Microelectron. Reliab.
Ke Gu, Juin J. Liou, Wei Li, Yang Liu, Ping Li
2014 J jnl
Design optimization of SiGe BiCMOS Silicon Controlled Rectifier for Charged Device Model (CDM) protection applications.
Microelectron. Reliab.
Qiang Cui, Srivatsan Parthasarathy, Javier A. Salcedo, Juin J. Liou, Jean-Jacques Hajjar, Yuanzhong Paul Zhou
2013 A conf
Challenges on designing electrostatic discharge protection solutions for low power electronics.
ISLPED
Juin J. Liou
2013 — conf
Integrated amorphous-Si TFT circuits for gate drivers on LCD panels.
ASICON
Nan-Xiong Huang, Hsi Rong Han, Wen Tui Liao, Chih-Hung Huang, Wen Chun Wang, Miin-Shyue Shiau, Ching-Hwa Cheng, Hong-Chong Wu, Heng-Shou Hsu, Juin J. Liou, Shry-Sann Liao, Ruei-Cheng Sun, Guang-Bao Lu, Don-Gey Liu
2013 J jnl
Novel ESD protection solution for single-ended mixer in GaAs pHEMT technology.
Microelectron. Reliab.
Qiang Cui, Shuyun Zhang, Juin J. Liou
2013 J jnl
Revisiting MOSFET threshold voltage extraction methods.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Alberto Terán Barrios, Juin J. Liou, Ching-Sung Ho
2013 J jnl
vfTLP-V
Microelectron. Reliab.
Yuanzhong Paul Zhou, David Ellis, Jean-Jacques Hajjar, Andrew Olney, Juin J. Liou
2012 — conf
Electrostatic discharge (ESD) protection of RF integrated circuits.
APCCAS
Juin J. Liou, Chang Jiang, Feng Chia
2011 J jnl
A fully on-chip ESD protection UWB-band low noise amplifier using GaAs enhancement-mode dual-gate pHEMT technology.
Microelectron. Reliab.
Hsien-Chin Chiu, Chia-Shih Cheng, Hsuan-Ling Kao, Jeffrey S. Fu, Qiang Cui, Juin J. Liou
2011 — conf
Challenges of electrostatic discharge (ESD) protection in emerging silicon nanowire technology.
ASICON
Juin J. Liou, Chang Jiang, Cao Guang-Biao, Chang Gung, Feng Chia
2011 J jnl
Self-protection capability of integrated NLDMOS power arrays in ESD pulse regimes.
Microelectron. Reliab.
Blerina Aliaj, Vladislav A. Vashchenko, Andrei Shibkov, Juin J. Liou
2011 J jnl
Thermal reliability of VCO using InGaP/GaAs HBTs.
Microelectron. Reliab.
Xiang Liu, Jiann-Shiun Yuan, Juin J. Liou
2010 J jnl
Editorial.
Microelectron. Reliab.
Juin J. Liou, Chao-Sung Lai
2010 J jnl
Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar low-noise amplifier performance.
Microelectron. Reliab.
Xiang Liu, Jiann-Shiun Yuan, Juin J. Liou
2010 J jnl
Integration-based approach to evaluate the sub-threshold slope of MOSFETs.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Ching-Sung Ho
2009 J jnl
Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors.
Microelectron. Reliab.
Hei Wong, Y. Fu, Juin J. Liou, Y. Yue
2009 J jnl
Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Denise C. Lugo Muñoz, Álvaro D. Latorre Rey, Ching-Sung Ho, Juin J. Liou
2008 J jnl
Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology.
Microelectron. Reliab.
Xiaoyang Du, Shurong Dong, Yan Han, Juin J. Liou, Mingxu Huo, You Li, Qiang Cui, Dahai Huang, Demiao Wang
2008 J jnl
InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability.
Microelectron. Reliab.
Xiang Liu, Jiann-Shiun Yuan, Juin J. Liou
2008 J jnl
Investigation of diode geometry and metal line pattern for robust ESD protection applications.
Microelectron. Reliab.
You Li, Juin J. Liou, Jim Vinson
2007 J jnl
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.
Microelectron. Reliab.
Y. Fu, Hei Wong, Juin J. Liou
2007 J jnl
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy.
Microelectron. Reliab.
You-Lin Wu, Shi-Tin Lin, Tsung-Min Chang, Juin J. Liou
2006 J jnl
On-chip electrostatic discharge protection for CMOS gas sensor systems-on-a-chip (SoC).
Microelectron. Reliab.
Javier A. Salcedo, Juin J. Liou, Muhammad Yaqub Afridi, Allen R. Hefner
2005 J jnl
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect.
Microelectron. Reliab.
Ching-Sung Ho, Kuo-Yin Huang, Ming Tang, Juin J. Liou
2005 — conf
Novel electrostatic discharge protection structure for a monolithic gas sensor systems-on-a-chip.
ISCAS (1)
Javier A. Salcedo, Juin J. Liou, Muhammad Yaqub Afridi, Allen R. Hefner
2003 J jnl
Optimization of on-chip ESD protection structures for minimal parasitic capacitance.
Microelectron. Reliab.
Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg D. Croft, Waisum Wong, Satya Vishwanathan
2002 J jnl
A review of recent MOSFET threshold voltage extraction methods.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue
2002 J jnl
Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg D. Croft, Adelmo Ortiz-Conde
2002 J jnl
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs.
Microelectron. Reliab.
Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, Ching-Sung Ho
2002 J jnl
Statistical modeling of MOS devices for parametric yield prediction.
Microelectron. Reliab.
Juin J. Liou, Qiang Zhang, John McMacken, J. Ross Thomson, Kevin Stiles, Paul Layman
2001 J jnl
A Generalized Finite Element Method for Hydrodynamic Modeling of Short-channel Devices.
VLSI Design
Min Shen, Ming-C. Cheng, Juin J. Liou
2001 J jnl
An Upstream Flux Splitting Method for Hydrodynamic Modeling of Deep Submicron Devices.
VLSI Design
Min Shen, Wai-Kay Yip, Ming-C. Cheng, Juin J. Liou
2001 J jnl
An improved experimental setup for electrostatic discharge (ESD) measurements based on transmission line pulsing technique.
IEEE Trans. Instrum. Meas.
Jui-Chu Lee, R. Young, Juin J. Liou, Gregg D. Croft, Joseph C. Bernier
2001 J jnl
SPICE modeling and quick estimation of MOSFET mismatch based on BSIM3 model and parametric tests.
IEEE J. Solid State Circuits
Qiang Zhang, Juin J. Liou, John McMacken, J. Ross Thomson, Paul Layman
2001 J jnl
Semiconductor devices for RF applications: evolution and current status.
Microelectron. Reliab.
F. Schwierz, Juin J. Liou
2000 C conf
An efficient and practical MOS statistical model for digital applications.
ISCAS
Qiang Zhang, Juin J. Liou, John McMacken, Kevin Stiles, J. Ross Thomson, Paul Layman
2000 J jnl
Electrostatic discharge in semiconductor devices: protection techniques.
Proc. IEEE
Jim Vinson, Juin J. Liou
1998 J jnl
Electrostatic discharge in semiconductor devices: an overview.
Proc. IEEE
Jim Vinson, Juin J. Liou
1996 J jnl
A Mixed Analog/Digital VLSI Design and Simulation of An Adaptive Resonance Theory (ART) Neural Network Architecture.
Simul.
Ching S. Ho, Juin J. Liou, Michael Georgiopoulos, Christos G. Christodoulou
1994 J jnl
JFET circuit simulation using SPICE implemented with an improved model.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
W. W. Wong, Juin J. Liou
1991 Misc conf
Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits.
VTS
Waisum Wong, Juin J. Liou, Jiann-Shiun Yuan, David M. Wu
1991 Misc conf
Testing the impact of process defects on ECL power-delay performance.
VTS
Jiann-Shiun Yuan, Juin J. Liou, David M. Wu
1990 J jnl
An improved latching pulse design for dynamic sense amplifiers.
IEEE J. Solid State Circuits
Jiann S. Yuan, Juin J. Liou
1988 J jnl
Capacitance of semiconductor p-n junction space-charge layers: an overview.
Proc. IEEE
Juin J. Liou, Frederik A. Lindholm