Juhani Rauhamaa

15 papers B 1C 1Misc 3Journal 5Unranked 5
YearRankTypeTitle / Venue / Authors
2012 — conf
A novel method for quick on-line segmentation based on sparsity.
EUSIPCO
Juho Vihonen, Juhani Rauhamaa, Tommi Huotilainen, Ari Visa
2008 J jnl
Directional Filtering for Sequential Image Analysis.
IEEE Signal Process. Lett.
Juho Vihonen, Juha Jylhä, Timo Ala-Kleemola, Marja Ruotsalainen, Jarmo Kauppila, Tommi Huotilainen, Juhani Rauhamaa, Ari Visa
2007 J jnl
Metadata in Sequential Real-Time 2-D Detection.
IEEE Signal Process. Lett.
Juho Vihonen, Timo Ala-Kleemola, Juha Jylhä, Riitta Kerminen, Juhani Rauhamaa, Ari Visa
2006 J jnl
Fourier-Based Object Description in Defect Image Retrieval.
Mach. Vis. Appl.
Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa
2006 J jnl
Multiscale Fourier descriptors for defect image retrieval.
Pattern Recognit. Lett.
Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa
2005 — conf
Classification of non-homogenous images using classification probability vector.
ICIP (1)
Leena Lepistö, Iivari Kunttu, Jorma Autio, Juhani Rauhamaa, Ari Visa
2005 Misc conf
Color Fourier Descriptor for Defect Image Retrieval.
ICIAP
Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa
2004 — conf
Multiscale Fourier Descriptor for Shape-Based Image Retrieval.
ICPR (2)
Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa
2003 — conf
Binary Co-occurrence Matrix in Image Database Indexing.
SCIA
Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa
2003 Misc conf
Binary Histogram in Image Classification for Retrieval Purposes.
WSCG
Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa
2003 — conf
Classification method for defect images based on association and clustering.
Data Mining and Knowledge Discovery: Theory, Tools, and Technology
Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa
2003 Misc conf
Multiscale Fourier descriptor for shape classification.
ICIAP
Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa
2002 C conf
Content-based image retrieval in surface inspection.
ICARCV
Jukka Iivarinen, Jussi Pakkanen, Juhani Rauhamaa
2000 J jnl
A Defect Detection Scheme for Web Surface Inspection.
Int. J. Pattern Recognit. Artif. Intell.
Jukka Iivarinen, Katriina Heikkinen, Juhani Rauhamaa, Petri Vuorimaa, Ari Visa
1996 B conf
Unsupervised segmentation of surface defects.
ICPR
Jukka Iivarinen, Juhani Rauhamaa, Ari Visa