| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Computers
|
| 2023 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2023 | J | jnl |
IEEE Trans. Computers
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2022 | J | jnl |
Microprocess. Microsystems
|
| 2022 | J | jnl |
Comput. Electr. Eng.
|
| 2022 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2021 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Integr.
|
| 2021 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | — | conf |
ICECS
|
| 2020 | J | jnl |
IEEE Trans. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | — | conf |
DCIS
|
| 2020 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2020 | J | jnl |
Circuits Syst. Signal Process.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Trans. Computers
|
| 2019 | J | jnl |
IEEE Trans. Computers
|
| 2019 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2018 | J | jnl |
IEEE Trans. Computers
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2018 | J | jnl |
IEEE Trans. Computers
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
IEEE Comput. Archit. Lett.
|
| 2017 | J | jnl |
IEEE Trans. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
IEEE Trans. Computers
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
IEEE Trans. Computers
|
| 2016 | J | jnl |
IEEE Trans. Parallel Distributed Syst.
|
| 2016 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | C | conf |
IOLTS
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
Inf. Process. Lett.
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
IEEE Trans. Computers
|
| 2016 | J | jnl |
IEEE Trans. Computers
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | — | conf |
DFTS
|
| 2015 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | J | jnl |
IEEE Trans. Computers
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2014 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
Comput. Commun.
|
| 2014 | J | jnl |
IEEE Commun. Lett.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
IEEE Commun. Lett.
|
| 2014 | J | jnl |
Microprocess. Microsystems
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2013 | J | jnl |
IEEE Des. Test
|
| 2013 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2013 | J | jnl |
IEEE Comput. Archit. Lett.
|
| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2013 | — | conf |
DFTS
|
| 2013 | J | jnl |
IEEE Trans. Computers
|
| 2013 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2013 | J | jnl |
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication.
Microprocess. Microsystems
|
| 2013 | J | jnl |
IEEE Trans. Reliab.
|
| 2012 | — | conf |
HPCS
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2012 | C | conf |
IOLTS
|
| 2012 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2012 | J | jnl |
J. Supercomput.
|
| 2012 | J | jnl |
Trans. Emerg. Telecommun. Technol.
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
IEEE Commun. Lett.
|
| 2011 | A* | conf |
DAC
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2011 | J | jnl |
Int. J. Commun. Networks Distributed Syst.
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
IEEE Trans. Computers
|
| 2011 | — | conf |
Networking Workshops
|
| 2011 | J | jnl |
J. Discrete Algorithms
|
| 2011 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2011 | J | jnl |
Opt. Switch. Netw.
|
| 2011 | B | conf |
Networking (1)
|
| 2011 | C | conf |
DDECS
|
| 2010 | J | jnl |
IEEE Internet Comput.
|
| 2010 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2010 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2010 | J | jnl |
IEEE Commun. Mag.
|
| 2010 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2009 | J | jnl |
Microelectron. Reliab.
|
| 2009 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2009 | J | jnl |
IEEE Commun. Lett.
|
| 2009 | J | jnl |
Integr.
|
| 2009 | J | jnl |
IEEE Trans. Reliab.
|
| 2009 | C | conf |
IOLTS
|
| 2008 | J | jnl |
J. Signal Process. Syst.
|
| 2008 | A* | conf |
DAC
|
| 2007 | C | conf |
DDECS
|
| 2004 | J | jnl |
Des. Autom. Embed. Syst.
|
| 1999 | A | conf |
DATE
|
| 1998 | — | conf |
EUROMICRO
|
| 1998 | A | conf |
DATE
|