José Vicente Calvano

18 papers A 1Misc 3Journal 3Unranked 11
YearRankTypeTitle / Venue / Authors
2007 J jnl
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis.
J. Electron. Test.
Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
2007 J jnl
Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits
CoRR
Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho
2006 Misc conf
Functional Test of Field Programmable Analog Arrays.
VTS
Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
2006 — conf
Using Swarm Intelligence to Solve Some Analog Test Issues.
LATW
Carlos E. F. Savioli, Claudio E. C. Szendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho
2005 A conf
Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits.
DATE
Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho
2004 — conf
ATPG for fault diagnosis on analog electrical networks using evolutionary techniques.
SBCCI
Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho
2003 — conf
Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors.
IWSOC
José Vicente Calvano, Marcelo Lubaszewski
2002 — conf
Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order.
LATW
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho
2002 Misc conf
Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus.
VTS
José Vicente Calvano, Vladimir Castro Alves, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski
2002 — conf
State Model Approach for Analog Fault Modeling.
LATW
José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski, Vladimir Castro Alves
2001 — conf
Designing Testable Networks for Transfer Function Realization.
LATW
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho
2001 J jnl
Fault Models and Test Generation for OpAmp Circuits - The FFM.
J. Electron. Test.
José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski
2001 — conf
Filter Sensitivity Analysis Using the TRAM.
LATW
José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski
2000 Misc conf
Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations.
VTS
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski
2000 — conf
Fault Models and Compact Test Vectors for MOS OpAmp circuits.
SBCCI
José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho
2000 — conf
Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method.
LATW
José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski
2000 — conf
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers.
Asian Test Symposium
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski
2000 — conf
The Use of Macromodels on Op-Amp Circuits Fault Modeling.
LATW
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski