| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2016 | — | conf |
LASCAS
|
| 2015 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2012 | — | conf |
LATW
|
| 2010 | — | conf |
DELTA
|
| 2010 | B | conf |
ETS
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2008 | — | conf |
SBCCI
|
| 2008 | — | conf |
DELTA
|
| 2007 | — | conf |
SBCCI
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2004 | J | jnl |
IEEE J. Solid State Circuits
|
| 2004 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2004 | — | conf |
IFIP Congress Tutorials
|
| 2004 | — | conf |
SBCCI
|
| 2003 | J | jnl |
IEEE J. Solid State Circuits
|
| 2002 | J | jnl |
VLSI Design
|
| 2002 | J | jnl |
IEEE Des. Test Comput.
|
| 2002 | J | jnl |
IEEE Des. Test Comput.
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2000 | — | conf |
Asian Test Symposium
|
| 1999 | J | jnl |
J. Electron. Test.
|
| 1998 | J | jnl |
IEEE J. Solid State Circuits
|
| 1998 | A | conf |
DATE
|
| 1997 | — | conf |
ED&TC
|
| 1997 | J | jnl |
IEEE Trans. Fuzzy Syst.
|
| 1997 | A* | conf |
SWITTEST: Automatic Switch-Level Fault Simulation and Test Evaluation of Switched-Capacitor Systems.
DAC
|
| 1995 | J | jnl |
J. Electron. Test.
|
| 1995 | A | conf |
ICCAD
|
| 1994 | — | conf |
NIPS
|
| 1994 | Misc | conf |
VTS
|
| 1993 | C | conf |
ISCAS
|
| 1993 | C | conf |
ISCAS
|
| 1993 | J | jnl |
J. Electron. Test.
|
| 1992 | J | jnl |
IEEE J. Solid State Circuits
|
| 1992 | Misc | conf |
VTS
|
| 1991 | Misc | conf |
IWANN
|
| 1990 | — | conf |
EURO-DAC
|
| 1978 | — | conf |
MVL
|
| 1978 | — | conf |
MVL
|