Joseph P. Sullivan

11 papers A 1B 1C 3Journal 3Unranked 3
YearRankTypeTitle / Venue / Authors
2024 J jnl
A novel ML-driven test case selection approach for enhancing the performance of grammatical evolution.
Frontiers Comput. Sci.
Krishn Kumar Gupt, Meghana Kshirsagar, Douglas Mota Dias, Joseph P. Sullivan, Conor Ryan
2024 B conf
Fuzzy Pattern Trees for Classification Problems Using Genetic Programming.
EuroGP
Allan de Lima, Samuel Carvalho, Douglas Mota Dias, Jorge Luís Machado do Amaral, Joseph P. Sullivan, Conor Ryan
2023 J jnl
A Novel ML-driven Test Case Selection Approach for Enhancing the Performance of Grammatical Evolution.
CoRR
Krishn Kumar Gupt, Meghana Kshirsagar, Douglas Mota Dias, Joseph P. Sullivan, Conor Ryan
2023 C conf
Adaptive Case Selection for Symbolic Regression in Grammatical Evolution.
IJCCI
Krishn Kumar Gupt, Meghana Kshirsagar, Douglas Mota Dias, Joseph P. Sullivan, Conor Ryan
2023 — conf
Leap Mapping: Improving Grammatical Evolution for Modularity Problems.
GECCO Companion
Allan de Lima, Samuel Carvalho, Douglas Mota Dias, Joseph P. Sullivan, Conor Ryan
2023 C conf
On Switching Selection Methods to Increase Parsimony Pressure.
IJCCI
Allan de Lima, Samuel Carvalho, Douglas Mota Dias, Joseph P. Sullivan, Conor Ryan
2022 J jnl
Insights Into Incorporating Trustworthiness and Ethics in AI Systems With Explainable AI.
Int. J. Nat. Comput. Res.
Meghana Kshirsagar, Krishn Kumar Gupt, Gauri Vaidya, Conor Ryan, Joseph P. Sullivan, Vivek Kshirsagar
2022 A conf
Lexi
GECCO
Allan de Lima, Samuel Carvalho, Douglas Mota Dias, Enrique Naredo, Joseph P. Sullivan, Conor Ryan
2022 — conf
PreDive: preserving diversity in test cases for evolving digital circuits using grammatical evolution.
GECCO Companion
Krishn Kumar Gupt, Meghana Kshirsagar, Lukas Rosenbauer, Joseph P. Sullivan, Douglas Mota Dias, Conor Ryan
2021 — conf
Automatic Test Case Generation for Vulnerability Analysis of Galois Field Arithmetic Circuits.
CSP
Krishn Kumar Gupt, Meghana Kshirsagar, Joseph P. Sullivan, Conor Ryan
2021 C conf
Hierarchical Clustering Driven Test Case Selection in Digital Circuits.
ICSOFT
Conor Ryan, Meghana Kshirsagar, Krishn Kumar Gupt, Lukas Rosenbauer, Joseph P. Sullivan