Joseph B. Bernstein

20 papers A 1C 1Journal 10Unranked 7

Year	Rank	Type	Title / Venue / Authors
2023	—	`conf`	The Correct Hot Carrier Degradation Model. IRPS Joseph B. Bernstein, Emmanuel Bender, Alain Bensoussan
2023	—	`conf`	The Effects of Process Variations and BTI in Packaged FinFET Devices. IRPS Emmanuel Bender, Joseph B. Bernstein, Duane S. Boning
2021	J	`jnl`	Microchip Health Monitoring System Using the FLL Circuit. Sensors Emmanuel Bender, Joseph B. Bernstein
2018	J	`jnl`	An improved reliability model for Si and GaN power FET. Microelectron. Reliab. Gady Golan, Moshe Azoulay, Tsuriel Avraham, Ilan Kremenetsky, Joseph B. Bernstein
2017	J	`jnl`	Reliability prediction with MTOL. Microelectron. Reliab. Joseph B. Bernstein, Alain Bensoussan, Emmanuel Bender
2014	J	`jnl`	Reliability matrix solution to multiple mechanism prediction. Microelectron. Reliab. Joseph B. Bernstein, Moti Gabbay, Ofir Delly
2012	J	`jnl`	Structural health monitoring of solder joints in QFN package. Microelectron. Reliab. I. Gershman, Joseph B. Bernstein
2011	J	`jnl`	Hardware Error Likelihood Induced by the Operation of Software. IEEE Trans. Reliab. Bing Huang, Manuel Rodríguez, Ming Li, Joseph B. Bernstein, Carol S. Smidts
2009	J	`jnl`	Assessment of acceleration models used for BGA solder joint reliability studies. Microelectron. Reliab. Liyu Yang, Joseph B. Bernstein, T. Koschmieder
2009	J	`jnl`	Failure rate estimation of known failure mechanisms of electronic packages. Microelectron. Reliab. Liyu Yang, Joseph B. Bernstein
2006	J	`jnl`	Electronic circuit reliability modeling. Microelectron. Reliab. Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor
2005	—	`conf`	Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. ISQED Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein
2005	J	`jnl`	Detailed study and projection of hard breakdown evolution in ultra-thin gate oxides. Microelectron. Reliab. John S. Suehle, Baozhong Zhu, Yuan Chen, Joseph B. Bernstein
2005	—	`conf`	Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature. ISQED Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein
2005	A	`conf`	Study of the Impact of Hardware Fault on Software Reliability. ISSRE Bing Huang, Xiaojun Li, Ming Li, Joseph B. Bernstein, Carol S. Smidts
2004	—	`conf`	A High Performance Radiation-Hard Field Programmable Analog Array . ISQED Ji Luo, Joseph B. Bernstein, J. Ari Tuchman, Hu Huang, Kuan-Jung Chung, Anthony L. Wilson
2004	C	`conf`	Combined Channel Segmentation and Buffer Insertion for Routability and Performance Improvement of Field. ICCD Hu Huang, Joseph B. Bernstein, Martin Peckerar, Ji Luo
2002	—	`conf`	Reliable Laser Programmable Gate Array Technology. ISQED Zhuo Gao, Ji Luo, Hu Huang, Wei Zhang, Joseph B. Bernstein
1998	—	`conf`	Laser formed connections for programmable wiring. CICC Joseph B. Bernstein, Wei Zhang, Carl H. Nicholas
1990	—	`—`	Electrical characterization of polymeric insulation by electrically stimulated acoustic wave measurements. Joseph B. Bernstein