Josep Rius

19 papers A 2B 1C 2Misc 2Journal 7Unranked 5
YearRankTypeTitle / Venue / Authors
2015 J jnl
Supply Noise and Impedance of On-Chip Power Distribution Networks in ICs With Nonuniform Power Consumption and Interblock Decoupling Capacitors.
IEEE Trans. Very Large Scale Integr. Syst.
Josep Rius
2013 J jnl
IR-Drop in On-Chip Power Distribution Networks of ICs With Nonuniform Power Consumption.
IEEE Trans. Very Large Scale Integr. Syst.
Josep Rius
2010 C conf
A method for detecting resistive opens in buses.
IOLTS
Josep Rius
2010 — conf
A single conductive surface as communication media for networked devices.
BODYNETS
Josep Rius
2010 — conf
Two-dimensional communication of networked devices through a single conductive surface.
INSS
Josep Rius
2009 B conf
A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits.
ETS
Josep Rius, Luis Elvira Villagra, Maurice Meijer
2009 J jnl
Analysis of the Influence of Substrate on the Performance of On-Chip MOS Decoupling Capacitors.
IEEE J. Solid State Circuits
Josep Rius, Maurice Meijer
2009 C conf
Analysis of the extra delay on interconnects caused by resistive opens and shorts.
IOLTS
Pablo Maqueda, Josep Rius
2006 J jnl
An Activity Monitor for Power/Performance Tuning of CMOS Digital Circuits.
J. Low Power Electron.
Josep Rius, Maurice Meijer, José Pineda de Gyvez
2005 — conf
An Activity Monitor for Power/Performance Tuning of CMOS Digital Circuits.
PATMOS
Josep Rius, José Pineda de Gyvez, Maurice Meijer
2004 Misc conf
BIST Technique by Equally Spaced Test Vector Sequences.
VTS
Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
2003 — conf
On the selection of efficient arithmetic additive test pattern generators [logic test].
ETW
Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
2003 — conf
Power and Energy Consumption of CMOS Circuits: Measurement Methods and Experimental Results.
PATMOS
Josep Rius, Alejandro Peidro, Salvador Manich, Rosa Rodríguez-Sánchez
2002 A conf
Comparison of IDDQ Testing and Very-Low Voltage Testing.
ITC
Bram Kruseman, Stefan van den Oetelaar, Josep Rius
1999 A conf
Exploring the Combination of IDDQ and iDDt Testing: Energy Testing.
DATE
Josep Rius, Joan Figueras
1998 J jnl
IDDQ testing: state of the art and future trends.
Integr.
Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
1996 J jnl
Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments.
J. Electron. Test.
Josep Rius, Joan Figueras
1995 Misc conf
Detecting I
VTS
Josep Rius, Joan Figueras
1992 J jnl
Proportional BIC sensor for current testing.
J. Electron. Test.
Josep Rius, Joan Figueras