Josep Altet

44 papers A 4B 1C 3Misc 4Journal 23Unranked 9
YearRankTypeTitle / Venue / Authors
2025 — conf
Approximate Circuits Versus Quantization for Energy Efficient Deep Neural Networks.
DCIS
Jordi Fornt, Pau Fontova-Musté, Martí Caro, Jaume Abella, Josep Altet, Antonio Rubio, Francesc Moll
2025 A conf
GAVINA: flexible aggressive undervolting for bit-serial mixed-precision DNN acceleration.
ISLPED
Jordi Fornt, Pau Fontova-Musté, Adrian Gras, Omar Lahyani, Martí Caro, Jaume Abella, Francesc Moll, Josep Altet
2025 J jnl
GAVINA: flexible aggressive undervolting for bit-serial mixed-precision DNN acceleration.
CoRR
Jordi Fornt, Pau Fontova-Musté, Adrian Gras, Omar Lahyani, Martí Caro, Jaume Abella, Francesc Moll, Josep Altet
2025 J jnl
Mix-GEMM: Extending RISC-V CPUs for Energy-Efficient Mixed-Precision DNN Inference Using Binary Segmentation.
IEEE Trans. Computers
Jordi Fornt, Enrico Reggiani, Pau Fontova-Musté, Narcís Rodas, Alessandro Pappalardo, Osman Sabri Unsal, Adrián Cristal Kestelman, Josep Altet, Francesc Moll, Jaume Abella
2023 J jnl
Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements.
Sensors
Josep Altet, Xavier Aragonès, Enrique Barajas, Xavier Gisbert, Sergio Martínez, Diego Mateo
2023 J jnl
An Automotive Case Study on the Limits of Approximation for Object Detection.
CoRR
Martí Caro, Hamid Tabani, Jaume Abella, Francesc Moll, Enric Morancho, Ramon Canal, Josep Altet, Antonio Calomarde, Francisco J. Cazorla, Antonio Rubio, Pau Fontova, Jordi Fornt
2023 J jnl
An Energy-Efficient GeMM-Based Convolution Accelerator With On-the-Fly im2col.
IEEE Trans. Very Large Scale Integr. Syst.
Jordi Fornt, Pau Fontova-Musté, Martí Caro, Jaume Abella, Francesc Moll, Josep Altet, Christoph Studer
2023 J jnl
An automotive case study on the limits of approximation for object detection.
J. Syst. Archit.
Martí Caro, Hamid Tabani, Jaume Abella, Francesc Moll, Enric Morancho, Ramon Canal, Josep Altet, Antonio Calomarde, Francisco J. Cazorla, Antonio Rubio, Pau Fontova, Jordi Fornt
2022 — conf
Two examples of approximate arithmetic to reduce hardware complexity and power consumption.
DCIS
Jordi Fornt, Leixin Jin, Imanol Etxezarreta, Pau Fontova, Josep Altet, Antonio Calomarde, Enric Morancho, Francesc Moll, Antonio Rubio
2021 J jnl
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits.
Sensors
Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter
2019 — conf
Design of ULV ULP LNAs Exploiting FBB in FDSOI 28nm Technology.
DCIS
Xavier Aragonès, Alex Alvarez, Juan Pablo Rovayo, Josep Altet, Diego Mateo
2019 J jnl
Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology.
Sensors
Enrique Barajas, Xavier Aragonès, Diego Mateo, Josep Altet
2019 — conf
On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits.
DCIS
Anant Rungta, Josep Altet, Enrique Barajas, Antonio Rubio, Xavier Aragonès, Diego Mateo
2019 J jnl
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging.
IEEE Trans. Instrum. Meas.
Xavier Perpiñà, Ferran Reverter, Javier Leon, Enrique Barajas, Miquel Vellvehí, Xavier Jordà, Josep Altet
2015 J jnl
On-Chip Thermal Testing Using MOSFETs in Weak Inversion.
IEEE Trans. Instrum. Meas.
Ferran Reverter, Josep Altet
2014 J jnl
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.
Microelectron. J.
Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà
2014 — conf
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.
MWSCAS
Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo
2013 Misc conf
Defect-oriented non-intrusive RF test using on-chip temperature sensors.
VTS
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
2012 A conf
DC temperature measurements for power gain monitoring in RF power amplifiers.
ITC
Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà
2012 — conf
Design of a fully integrated CMOS self-testable RF power amplifier using a thermal sensor.
ESSCIRC
Nathalie Deltimple, José Luis González, Josep Altet, Yohann Luque, Eric Kerherve
2012 J jnl
Electro-thermal coupling analysis methodology for RF circuits.
Microelectron. J.
Didac Gómez, Cédric Dufis, Josep Altet, Diego Mateo, José Luis González
2012 C conf
On line monitoring of RF power amplifiers with embedded temperature sensors.
IOLTS
Josep Altet, Diego Mateo, Didac Gómez
2012 J jnl
On the Use of Static Temperature Measurements as Process Variation Observable.
J. Electron. Test.
Didac Gómez, Josep Altet, Diego Mateo
2012 A conf
Testing RF circuits with true non-intrusive built-in sensors.
DATE
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
2011 J jnl
Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor.
IEEE Trans. Circuits Syst. I Regul. Pap.
Marvin Onabajo, Josep Altet, Eduardo Aldrete-Vidrio, Diego Mateo, José Silva-Martínez
2011 — conf
Monitor strategies for variability reduction considering correlation between power and timing variability.
SoCC
Joan Mauricio, Francesc Moll, Josep Altet
2011 J jnl
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations.
J. Electron. Test.
Marvin Onabajo, Didac Gómez, Eduardo Aldrete-Vidrio, Josep Altet, Diego Mateo, José Silva-Martínez
2010 C conf
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits.
IOLTS
Josep Altet, Diego Mateo, Eduardo Aldrete-Vidrio
2009 A conf
Non-invasive RF built-in testing using on-chip temperature sensors.
ITC
Eduardo Aldrete-Vidrio, Marvin Onabajo, Josep Altet, Diego Mateo, José Silva-Martínez
2008 B conf
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers.
ETS
Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire
2007 J jnl
Electrical characterization of analogue and RF integrated circuits by thermal measurements.
Microelectron. J.
Diego Mateo, Josep Altet, Eduardo Aldrete-Vidrio
2006 J jnl
Dynamic Surface Temperature Measurements in ICs.
Proc. IEEE
Josep Altet, Wilfrid Claeys, Stefan Dilhaire, Antonio Rubio
2006 C conf
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements.
ISCAS
Josep Altet, Diego Mateo, José Luis González, Eduardo Aldrete-Vidrio
2004 J jnl
Applications of temperature phase measurements to IC testing.
Microelectron. Reliab.
Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby
2004 Misc conf
Sensing temperature in CMOS circuits for Thermal Testing.
VTS
Josep Altet, Antonio Rubio, M. Amine Salhi, Jose Luis Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov
2003 J jnl
Structural RFIC device testing through built-in thermal monitoring.
IEEE Commun. Mag.
Josep Altet, Antonio J. Rubio, José Luis Rosselló, Jaume Segura
2003 J jnl
Thermal Testing of Analogue Integrated Circuits: A Case Study.
J. Electron. Test.
Josep Altet, André Ivanov, A. Wong
2002 J jnl
CMOS Differential and Absolute Thermal Sensors.
J. Electron. Test.
Ashish Syal, Victor Lee, André Ivanov, Josep Altet
2001 — conf
CMOS Differential and Absolute Thermal Sensors.
IOLTW
Ashish Syal, Victor Lee, André Ivanov, Josep Altet
2001 J jnl
Thermal coupling in integrated circuits: application to thermal testing.
IEEE J. Solid State Circuits
Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys
2000 Misc conf
Thermal Testing: Fault Location Strategies.
VTS
Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys
1999 J jnl
Differential Thermal Testing: An Approach to its Feasibility.
J. Electron. Test.
Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, Emmanuel Schaub, Hideo Tamamoto
1997 — conf
Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits.
Asian Test Symposium
Josep Altet, Antonio Rubio, Hideo Tamamoto
1997 Misc conf
Differential Sensing Strategy for Dynamic Thermal Testing of ICs.
VTS
Josep Altet, Antonio Rubio