Jose Moreira

14 papers A 5B 1Journal 1Unranked 6
YearRankTypeTitle / Venue / Authors
2023 — conf
FlexSEE: a Flexible Secure Execution Environment for protecting data-in-use.
CF
Jose Moreira, Jessica H. Tseng, Manoj Kumar, Eknath Ekanadham, Joefon Jann, Pratap C. Pattnaik, Gianfranco Bilardi, David Edelsohn, Henry M. Tufo
2023 — ed.
Proceedings of the 20th ACM International Conference on Computing Frontiers, CF 2023, Bologna, Italy, May 9-11, 2023
CF
Andrea Bartolini, Kristian F. D. Rietveld, Catherine D. Schuman, Jose Moreira
2021 A ed.
ICS '21: 2021 International Conference on Supercomputing, Virtual Event, USA, June 14-17, 2021.
ICS
Huiyang Zhou, Jose Moreira, Frank Mueller, Yoav Etsion
2020 B conf
Bandwidth Optimized Parallel Algorithms for Sparse Matrix-Matrix Multiplication using Propagation Blocking.
SPAA
Zhixiang Gu, Jose Moreira, David Edelsohn, Ariful Azad
2020 J jnl
Bandwidth-Optimized Parallel Algorithms for Sparse Matrix-Matrix Multiplication using Propagation Blocking.
CoRR
Zhixiang Gu, Jose Moreira, David Edelsohn, Ariful Azad
2020 — conf
Impact of DDDAS/InfoSymbiotics in the Industrial Sector.
DDDAS
Daniel Abramovitch, Sandeep Gogineni, Cory Kays, Chung-Sheng Li, Jose Moreira, Chitra Sivanandam, Nurali Virani
2014 — conf
An ATE Based 32 Gbaud PAM-4 At-Speed Characterization and Testing Solution.
ATS
Jose Moreira, Hubert Werkmann, Masahiro Ishida, Bernhard Roth, Volker Filsinger, Sui-Xia Yang
2013 — conf
An Active Test Fixture Approach for 40 Gbps and Above At-Speed Testing Using a Standard ATE System.
Asian Test Symposium
Jose Moreira, Bernhard Roth, Hubert Werkmann, Lars Klapproth, Michael Howieson, Mark Broman, Wend Ouedraogo, Mitchell Lin
2012 — conf
An Active Test Fixture Approach for Testing 28 Gbps Applications Using a Lower Data Rate ATE System.
Asian Test Symposium
Jose Moreira, Bernhard Roth, Callum McCowan
2012 — conf
Design of a High Bandwidth Interposer for Performance Evaluation of ATE Test Fixtures at the DUT Socket.
Asian Test Symposium
Jose Moreira
2012 A conf
Driver sharing challenges for DDR4 high-volume testing with ATE.
ITC
Jose Moreira, Marc Moessinger, Koji Sasaki, Takayuki Nakamura
2011 A conf
Development of an ATE test cell for at-speed characterization and production testing.
ITC
Jose Moreira
2008 A conf
Beyond 10 Gbps? Challenges of Characterizing Future I/O Interfaces with Automated Test Equipment.
ITC
Jose Moreira, Heidi Barnes, Hiroshi Kaga, Michael Comai, Bernhard Roth, Morgan Culver
2007 A conf
Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I/O characterization applications.
ITC
Jose Moreira, Heidi Barnes, Guenter Hoersch