Joris Roels - RankMe

14 papers B 1Journal 6Unranked 7

Year	Rank	Type	Title / Venue / Authors
2022	—	`conf`	BioSegment: Active Learning segmentation for 3D electron microscopy imaging. IAL@PKDD/ECML Benjamin Rombaut, Joris Roels, Yvan Saeys
2021	J	`jnl`	A Miniaturised, Fully Integrated NDIR CO2 Sensor On-Chip. Sensors Xiaoning Jia, Joris Roels, Roel Baets, Gunther Roelkens
2019	—	`conf`	Cost-Efficient Segmentation of Electron Microscopy Images Using Active Learning. BNAIC/BENELEARN Joris Roels, Yvan Saeys
2019	J	`jnl`	Cost-efficient segmentation of electron microscopy images using active learning. CoRR Joris Roels, Yvan Saeys
2019	—	`conf`	Domain Adaptive Segmentation In Volume Electron Microscopy Imaging. ISBI Joris Roels, Julian Hennies, Yvan Saeys, Wilfried Philips, Anna Kreshuk
2019	J	`jnl`	On-Chip Non-Dispersive Infrared CO2 Sensor Based On an Integrating Cylinder. Sensors Xiaoning Jia, Joris Roels, Roel Baets, Gunther Roelkens
2018	J	`jnl`	Bayesian Deconvolution of Scanning Electron Microscopy Images Using Point-spread Function Estimation and Non-local Regularization. CoRR Joris Roels, Jan Aelterman, Jonas De Vylder, Hiep Luong, Yvan Saeys, Wilfried Philips
2018	J	`jnl`	Convolutional Neural Network Pruning to Accelerate Membrane Segmentation in Electron Microscopy. CoRR Joris Roels, Jonas De Vylder, Jan Aelterman, Yvan Saeys, Wilfried Philips
2018	J	`jnl`	Domain Adaptive Segmentation in Volume Electron Microscopy Imaging. CoRR Joris Roels, Julian Hennies, Yvan Saeys, Wilfried Philips, Anna Kreshuk
2017	—	`conf`	Convolutional neural network pruning to accelerate membrane segmentation in electron microscopy. ISBI Joris Roels, Jonas De Vylder, Jan Aelterman, Yvan Saeys, Wilfried Philips
2017	—	`conf`	Lower bounds on the robustness to adversarial perturbations. NIPS Jonathan Peck, Joris Roels, Bart Goossens, Yvan Saeys
2016	—	`conf`	Bayesian deconvolution of scanning electron microscopy images using point-spread function estimation and non-local regularization. EMBC Joris Roels, Jan Aelterman, Jonas De Vylder, Hiêp Quang Luong, Yvan Saeys, Wilfried Philips
2016	B	`conf`	Decreasing Time Consumption of Microscopy Image Segmentation Through Parallel Processing on the GPU. ACIVS Joris Roels, Jonas De Vylder, Yvan Saeys, Bart Goossens, Wilfried Philips
2014	—	`conf`	Noise Analysis and Removal in 3D Electron Microscopy. ISVC (1) Joris Roels, Jan Aelterman, Jonas De Vylder, Hiêp Quang Luong, Yvan Saeys, Saskia Lippens, Wilfried Philips