Jorge Semião

47 papers A 1B 2C 12Misc 1Journal 11Unranked 19
YearRankTypeTitle / Venue / Authors
2026 J jnl
Stochastic Maintenance for a Large Fleet of Structures.
Dyn. Games Appl.
Alain Bensoussan, Alexandre Brouste, Marie-Amélie Morlais, Francois-Baptiste Cartiaux, Jorge Semião
2025 — conf
A Laboratory Fault-Injection Automation System for Industrial Pumping Predictive Maintenance.
ICPS
Gonçalo Azinheira, Sérgio Brito, Jorge Semião, Nelson Sousa
2022 — conf
DRAM Performance Sensor.
HCI (7)
Jorge Semião, Luís Santos, Marcelino B. Santos
2022 C conf
Quasi-Resonant DC-DC Converter Single-Switch for Single-Input Bipolar-Output Applications.
IECON
Cristian Díaz Martín, Eladio Durán Aranda, Salvador Pérez Litrán, Jorge Semião
2021 — conf
SRAM Performance Sensor.
DCIS
Jorge Semião, Luís Santos, Marcelino B. Santos
2020 — ch.
Internet of Things and Artificial Intelligence - A Wining Partnership?
Convergence of Artificial Intelligence and the Internet of Things
Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2019 C conf
A Zeta-CSC Converter Combination for Single-Input and Bipolar Output.
IECON
Salvador P. Litran, Eladio Durán, María Bella Ferrera, Jorge Semião, Rafael S. Barroso
2018 — conf
Development of an Energy Management System for the Charge Scheduling of Plug-in Electric Vehicles.
HCI (8)
Dario Cruz, Nelson Pinto, Jânio M. Monteiro, Pedro J. S. Cardoso, Cristiano Cabrita, Jorge Semião, Luís M. R. Oliveira, João M. F. Rodrigues
2018 — conf
Performance Sensor for Reliable Operation.
HCI (8)
Jorge Semião, Ruben Cabral, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2015 J jnl
Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling.
J. Low Power Electron.
Carlos Leong, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2015 — conf
Fault-tolerance in FPGA focusing power reduction or performance enhancement.
LATS
Carlos Leong, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2015 — conf
Integration of a Food Distribution Routing Optimization Software with an Enterprise Resource Planner.
GISTAM
Pedro J. S. Cardoso, Gabriela Schütz, Jorge Semião, Jânio M. Monteiro, João M. F. Rodrigues, Andriy Mazayev, Emanuel Ey Vieira, Micael Viegas, Carlos Neves, Sérgio Anastácio
2015 — conf
Integration of a Real-Time Stochastic Routing Optimization Software with an Enterprise Resource Planner.
GISTAM (Selected Papers)
Pedro J. S. Cardoso, Gabriela Schütz, Jorge Semião, Jânio M. Monteiro, João M. F. Rodrigues, Andriy Mazayev, Emanuel Ey, Micael Viegas
2014 — conf
A distributed load scheduling mechanism for micro grids.
SmartGridComm
Jânio M. Monteiro, Jorge Eduardo, Pedro J. S. Cardoso, Jorge Semião
2014 — conf
Performance sensor for tolerance and predictive detection of delay-faults.
DFT
Jorge Semião, David Saraiva, Carlos Leong, André Romão, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2013 B conf
Aging monitoring with local sensors in FPGA-based designs.
FPL
Carlos Leong, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas
2013 J jnl
Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion.
J. Electron. Test.
Julio César Vázquez, Víctor H. Champac, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
2012 J jnl
Aging-Aware Power or Frequency Tuning With Predictive Fault Detection.
IEEE Des. Test Comput.
Jackson Pachito, Celestino V. Martins, Bruno Jacinto, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2012 J jnl
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits.
J. Electron. Test.
Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
2012 C conf
The influence of clock-gating on NBTI-induced delay degradation.
IOLTS
Jackson Pachito, Celestino V. Martins, Jorge Semião, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira
2011 Misc conf
Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors.
VTS
Celestino V. Martins, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2011 J jnl
Lower
J. Low Power Electron.
Judit Freijedo, María Dolores Valdés, Lucía Costas, María José Moure, Juan J. Rodríguez-Andina, Jorge Semião, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
2011 — conf
Modeling the effect of process variations on the timing response of nanometer digital circuits.
LATW
Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
2011 J jnl
On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications.
J. Low Power Electron.
R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
2011 — conf
On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications.
LATW
R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
2011 B conf
Performance Failure Prediction Using Built-In Delay Sensors in FPGAs.
FPL
Vasco Bexiga, Carlos Leong, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas
2011 — conf
Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects.
LATW
María Dolores Valdés, Judit Freijedo, María José Moure, Juan J. Rodríguez-Andina, Jorge Semião, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
2010 J jnl
Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance.
J. Low Power Electron.
Judit Freijedo, Lucía Costas, Jorge Semião, Juan J. Rodríguez-Andina, María José Moure, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
2010 C conf
Investigating the Use of BICS to detect resistive-open defects in SRAMs.
IOLTS
Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas, Jorge Semião, Juan J. Rodríguez-Andina, Isabel C. Teixeira, João Paulo Teixeira
2010 C conf
Predictive error detection by on-line aging monitoring.
IOLTS
Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira
2009 C conf
Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies.
IOLTS
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2009 — conf
Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment.
LATW
Jorge Semião, Judit Freijedo, Marlon Moraes, M. Mallmann, Carlos Lemos Antunes, Juliano Benfica, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Juan J. Rodríguez-Andina, João Paulo Teixeira, Daniel Lupi, Edmundo Gatti, Luis Garcia, Fernando Hernandez
2008 J jnl
Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems.
J. Low Power Electron.
Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira
2008 C conf
Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits.
IOLTS
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2008 C conf
Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits.
DDECS
Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2008 — conf
Robust solution for synchronous communication among multi clock domains.
APCCAS
Jorge Semião, João Varela, Judit Freijedo, Juan J. Rodríguez-Andina, Carlos Leong, João Paulo Teixeira, Isabel C. Teixeira
2008 J jnl
Signal Integrity Enhancement in Digital Circuits.
IEEE Des. Test Comput.
Jorge Semião, Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Leonardo Bisch Piccoli, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira
2008 J jnl
Time Management for Low-Power Design of Digital Systems.
J. Low Power Electron.
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2007 — conf
Enhancing the Tolerance to Power-Supply Instability in Digital Circuits.
ISVLSI
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2007 C conf
Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits.
DDECS
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2007 — conf
Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations.
DFT
Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira
2007 C conf
On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits.
IOLTS
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2006 C conf
Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes.
IOLTS
Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira
2006 C conf
Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage.
DDECS
F. Guerreiro, Jorge Semião, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
2001 A conf
Embedded tutorial: TRP: integrating embedded test and ATE.
DATE
Yervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher
2000 — conf
Quality of Electronic Design: From Architectural Level to Test Coverage.
ISQED
Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira
1999 — conf
From system level to defect-oriented test: a case study.
ETW
Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira