Joonsung Park

17 papers A 1B 2Misc 2Journal 6Unranked 6
YearRankTypeTitle / Venue / Authors
2021 J jnl
Fault-based Built-in Self-test and Evaluation of Phase Locked Loops.
ACM Trans. Design Autom. Electr. Syst.
Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
2019 B conf
Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection.
ETS
Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
2017 — conf
A 12-/14-bit, 4/2MSPS, 0.085mm
CICC
Joonsung Park, Krishnaswamy Nagaraj, Mikel Ash, Ajay Kumar
2017 — conf
High precision yet wide range on-chip oscillator with dual charge-discharge technique.
ISQED
Abhijit Das, Joonsung Park
2016 — conf
An oxide electrothermal filter in standard CMOS.
IEEE SENSORS
Lorenzo Pedala, Ugur Sonmez, Fabio Sebastiano, Kofi A. A. Makinwa, Krishnaswamy Nagaraj, Joonsung Park
2015 J jnl
An Embedded 65 nm CMOS Remote Temperature Sensor With Digital Beta Correction and Series Resistance Cancellation Achieving an Inaccuracy of 0.4
IEEE J. Solid State Circuits
Xiao Pu, Mikel Ash, Krishnaswamy Nagaraj, Joonsung Park, Steve Vu, Paul Kimelman, Sean de la Haye
2013 J jnl
A Built-In Repair Analyzer With Optimal Repair Rate for Word-Oriented Memories.
IEEE Trans. Very Large Scale Integr. Syst.
Jaeyong Chung, Joonsung Park, Jacob A. Abraham
2011 J jnl
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
J. Electron. Test.
Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham
2011 J jnl
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model.
J. Electron. Test.
Joonsung Park, Hongjoong Shin, Jacob A. Abraham
2010 — conf
At-speed Test of High-Speed DUT Using Built-Off Test Interface.
Asian Test Symposium
Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh
2010 Misc conf
Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate.
VTS
Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo
2010 J jnl
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
J. Electron. Test.
Hongjoong Shin, Joonsung Park, Jacob A. Abraham
2009 — conf
LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits.
Asian Test Symposium
Joonsung Park, Jaeyong Chung, Jacob A. Abraham
2009 B conf
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
ETS
Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh
2008 Misc conf
Parallel Loopback Test of Mixed-Signal Circuits.
VTS
Joonsung Park, Hongjoong Shin, Jacob A. Abraham
2007 — conf
Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model.
ISQED
Joonsung Park, Hongjoong Shin, Jacob A. Abraham
2006 A conf
Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method.
ITC
Hongjoong Shin, Joonsung Park, Jacob A. Abraham