| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2009 | J | jnl |
IEICE Trans. Electron.
|
| 2009 | J | jnl |
Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design.
IEICE Trans. Electron.
|
| 2009 | J | jnl |
IEICE Trans. Electron.
|
| 2009 | J | jnl |
IEICE Trans. Electron.
|
| 2009 | J | jnl |
IEICE Trans. Electron.
|
| 2008 | J | jnl |
IEICE Trans. Electron.
|
| 2008 | J | jnl |
IEICE Trans. Electron.
|
| 2007 | J | jnl |
IEICE Trans. Electron.
|
| 2007 | J | jnl |
IEICE Trans. Electron.
|
| 2004 | J | jnl |
Microelectron. Reliab.
|
| 2004 | J | jnl |
IEEE J. Solid State Circuits
|
| 2003 | — | conf |
ISMVL
|
| 2003 | A | conf |
ISLPED
|