John M. Carulli Jr.

21 papers A 13B 1C 1Journal 4Unranked 2
YearRankTypeTitle / Venue / Authors
2016 A conf
Variation and failure characterization through pattern classification of test data from multiple test stages.
ITC
Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng
2015 A conf
A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits.
DATE
Hugo R. Gonçalves, Xin Li, Miguel V. Correia, Vítor Tavares, John M. Carulli Jr., Kenneth M. Butler
2015 J jnl
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models.
IEEE Des. Test
Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris
2014 A conf
Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling.
ITC
Shanghang Zhang, Xin Li, Ronald D. Blanton, José Machado da Silva, John M. Carulli Jr., Kenneth M. Butler
2014 A conf
IC laser trimming speed-up through wafer-level spatial correlation modeling.
ITC
Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris
2014 J jnl
Reliability improvement of logic and clock paths in power-efficient designs.
ACM J. Emerg. Technol. Comput. Syst.
Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli Jr., Gautam Kapila, Min Chen
2014 A conf
Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.
ITC
Ali Ahmadi, Ke Huang, Suriyaprakash Natarajan, John M. Carulli Jr., Yiorgos Makris
2013 A conf
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests.
DATE
Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
2013 B conf
On combining alternate test with spatial correlation modeling in analog/RF ICs.
ETS
Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
2013 — conf
Predicting die-level process variations from wafer test data for analog devices: A feasibility study.
LATW
Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee
2013 A conf
Process monitoring through wafer-level spatial variation decomposition.
ITC
Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
2012 — conf
Parametric counterfeit IC detection via Support Vector Machines.
DFT
Ke Huang, John M. Carulli Jr., Yiorgos Makris
2012 A conf
Spatial correlation modeling for probe test cost reduction in RF devices.
ICCAD
Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris
2012 A conf
Spatial estimation of wafer measurement parameters using Gaussian process models.
ITC
Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris
2011 A conf
Die-level adaptive test: Real-time test reordering and elimination.
ITC
Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar
2010 A conf
Adapting to adaptive testing.
DATE
Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli
2009 J jnl
Multidimensional Test Escape Rate Modeling.
IEEE Des. Test Comput.
Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch
2009 C conf
Quality improvement and cost reduction using statistical outlier methods.
ICCD
Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger
2008 A conf
Modeling Test Escape Rate as a Function of Multiple Coverages.
ITC
Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena
2006 J jnl
The Impact of Multiple Failure Modes on Estimating Product Field Reliability.
IEEE Des. Test Comput.
John M. Carulli Jr., Thomas J. Anderson
2005 A conf
Test connections - tying application to process.
ITC
John M. Carulli Jr., Thomas J. Anderson