John M. Carulli

20 papers A 8Misc 5Journal 5Unranked 2
YearRankTypeTitle / Venue / Authors
2025 Misc conf
Enhancing Metrology to E-test Correlation Model Accuracy through Process Expertise Integration.
VTS
Ching-Yi Chang, Matthew Nigh, John M. Carulli, Yiorgos Makris
2025 A conf
Unveiling the Mask: Trusted Semiconductor Manufacturing through Wafer-Level Mask-Set Attestation.
ICCAD
Suraag Sunil Tellakula, Ching-Yi Chang, Matthew Nigh, Christos Vasileiou, John M. Carulli, Yiorgos Makris
2024 A conf
Generation and Quality Evaluation of Synthetic Process Control Monitoring Data.
ITC
Matthew Nigh, John M. Carulli, Yiorgos Makris
2024 J jnl
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond.
IEEE Des. Test
Ke Huang, Yu Liu, Nenad Korolija, John M. Carulli, Yiorgos Makris
2017 A conf
Systematic defect detection methodology for volume diagnosis: A data mining perspective.
ITC
Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang
2017 J jnl
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
2016 Misc conf
Consistency in wafer based outlier screening.
VTS
Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli
2016 J jnl
Controlling Aging in Timing-Critical Paths.
IEEE Des. Test
Senthil Arasu, Mehrdad Nourani, John M. Carulli, Vijay Reddy
2016 A conf
Pylon: Towards an integrated customizable volume diagnosis infrastructure.
ITC
Yan Pan, Rao Desineni, Kannan Sekar, Atul Chittora, Sherwin Fernandes, Neerja Bawaskar, John M. Carulli
2015 J jnl
Recycled IC Detection Based on Statistical Methods.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ke Huang, Yu Liu, Nenad Korolija, John M. Carulli, Yiorgos Makris
2015 Misc conf
Yield prognosis for fab-to-fab product migration.
VTS
Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
2014 — conf
Asymmetric aging of clock networks in power efficient designs.
ISQED
Senthil Arasu, Mehrdad Nourani, Frank Cano, John M. Carulli, Vijay Reddy
2014 J jnl
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain.
Proc. IEEE
Ujjwal Guin, Ke Huang, Daniel DiMase, John M. Carulli, Mohammad Tehranipoor, Yiorgos Makris
2014 Misc conf
Innovative practices session 5C: Machine learning and data analysis in test.
VTS
Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee
2014 Misc conf
Special session 11B: ITRS adaptive test update.
VTS
John M. Carulli
2013 A conf
A design-for-reliability approach based on grading library cells for aging effects.
ITC
Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy
2013 A conf
Counterfeit electronics: A rising threat in the semiconductor manufacturing industry.
ITC
Ke Huang, John M. Carulli, Yiorgos Makris
2013 — conf
Performance entitlement by exploiting transistor's BTI recovery.
ISQED
Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli
2013 A conf
Test data analytics - Exploring spatial and test-item correlations in production test data.
ITC
Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler
2004 A conf
Impact of Negative Bias Temperature Instability on Product Parametric Drift.
ITC
Vijay Reddy, John M. Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess