John C. Liobe

15 papers C 5Journal 7Unranked 3
YearRankTypeTitle / Venue / Authors
2025 J jnl
Region of Interest-Focused Dynamic Enhancement (RoIDE) for Satellite Images.
IEEE Trans. Geosci. Remote. Sens.
Trong-An Bui, Pei-Jun Lee, John C. Liobe, Vaidotas Barzdenas, Dainius Udris
2022 J jnl
Analytical Review of Event-Based Camera Depth Estimation Methods and Systems.
Sensors
Justas Furmonas, John C. Liobe, Vaidotas Barzdenas
2021 J jnl
Applying smart devices for gathering real-time feedback from students.
Comput. Appl. Eng. Educ.
Gediminas Grazulevicius, Vaidotas Barzdenas, Aleksandr Vasjanov, John C. Liobe
2014 J jnl
Indirect-Feedback Sigma-Delta Image Sensors: Theory, Modeling and Design.
IEEE Trans. Circuits Syst. I Regul. Pap.
Zhe Gao, John C. Liobe, Mark F. Bocko, Zeljko Ignjatovic
2013 — conf
Implementing OCEAN scripts in RF circuit design.
NORCHIP
Aleksandr Vasjanov, Vaidotas Barzdenas, John C. Liobe
2013 C conf
Noise model of indirect-feedback sigma-delta image sensors.
ISCAS
Zhe Gao, John C. Liobe, Zeljko Ignjatovic, Mark F. Bocko
2012 — conf
pbCAM: Probabilistically-banked Content Addressable Memory.
SoCC
Tolga Soyata, John C. Liobe
2008 J jnl
A Novel Application of FM-ADC Toward the Self-Calibration of Phase-Locked Loops.
IEEE Trans. Circuits Syst. I Regul. Pap.
John C. Liobe, Richard Geisler, Martin Margala
2008 J jnl
Experimental Analysis of Substrate Noise Effect on PLL Performance.
IEEE Trans. Circuits Syst. II Express Briefs
Woogeun Rhee, Keith A. Jenkins, John C. Liobe, Herschel A. Ainspan
2007 C conf
Novel Process and Temperature-Stable BICS for Embedded Analog and Mixed-Signal Test.
IOLTS
John C. Liobe, Martin Margala
2007 J jnl
Novel Process and Temperature-Stable, IDD Sensor for the BIST Design of Embedded Digital, Analog, and Mixed-Signal Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap.
John C. Liobe, Martin Margala
2007 C conf
Process and Temperature Calibration of PLLs with BiST Capabilities.
ISCAS
Richard Geisler, John C. Liobe, Martin Margala
2006 C conf
Process tolerant calibration circuit for PLL applications with BIST.
ISCAS
Quentin Diduck, John C. Liobe, Sadeka Ali, Martin Margala
2005 — conf
A New Test Methodology For DNL Error In Flash ADC's.
DFT
Michael Wieckowski, John C. Liobe, Quentin Diduck, Martin Margala
2003 C conf
Deep-Submicron CMOS Design Methodology for High-Performance Low-Power Analog-to-Digital Converters.
VLSI-SOC
Martin Margala, John C. Liobe, Quentin Diduck