John A. Waicukauski

45 papers A* 5A 28Misc 7Journal 4Unranked 1

Year	Rank	Type	Title / Venue / Authors
2025	A	`conf`	Hybrid Static Learning for ATPG. ITC Jonathon E. Colburn, Peter Wohl, John A. Waicukauski, Yasunari Kanzawa
2025	—	`conf`	Improving ATPG through Abort-Driven Dynamic Learning (ADDLe). ITC-Asia Peter Wohl, John A. Waicukauski, Jonathon E. Colburn, Yasunari Kanzawa
2018	A	`conf`	XLBIST: X-Tolerant Logic BIST. ITC Peter Wohl, John A. Waicukauski, Gregory A. Maston, Jonathon E. Colburn
2017	A*	`conf`	A New Paradigm for Synthesis of Linear Decompressors. DAC Emil Gizdarski, Peter Wohl, John A. Waicukauski
2014	A	`conf`	Achieving extreme scan compression for SoC Designs. ITC Peter Wohl, John A. Waicukauski, Jonathon E. Colburn, Milind Sonawane
2013	Misc	`conf`	Improving test generation by use of majority gates. VTS Peter Wohl, John A. Waicukauski
2013	A	`conf`	Two-level compression through selective reseeding. ITC Peter Wohl, John A. Waicukauski, Frederic Neuveux, Gregory A. Maston, Nadir Achouri, Jonathon E. Colburn
2012	Misc	`conf`	Enhancing testability by structured partial scan. VTS Peter Wohl, John A. Waicukauski, Jonathon E. Colburn
2012	A	`conf`	Hybrid selector for high-X scan compression. ITC Peter Wohl, John A. Waicukauski, Frederic Neuveux, Jonathon E. Colburn
2010	A*	`conf`	Fully X-tolerant, very high scan compression. DAC Peter Wohl, John A. Waicukauski, Frederic Neuveux, Emil Gizdarski
2010	A	`conf`	Highly efficient parallel ATPG based on shared memory. ITC X. Cai, Peter Wohl, John A. Waicukauski, Pramod Notiyath
2010	A	`conf`	Increasing PRPG-based compression by delayed justification. ITC Peter Wohl, John A. Waicukauski, T. Finklea
2008	A	`conf`	Increasing Scan Compression by Using X-chains. ITC Peter Wohl, John A. Waicukauski, Frederic Neuveux
2007	Misc	`conf`	Automated Design and Insertion of Optimal One-Hot Bus Encoders. VTS Peter Wohl, John A. Waicukauski, Sanjay Patel
2007	A	`conf`	Fully X-tolerant combinational scan compression. ITC Peter Wohl, John A. Waicukauski, Sanjay Ramnath
2007	Misc	`conf`	Minimizing the Impact of Scan Compression. VTS Peter Wohl, John A. Waicukauski, Rohit Kapur, Sanjay Ramnath, Emil Gizdarski, Thomas W. Williams, P. Jaini
2005	A	`conf`	Efficient compression of deterministic patterns into multiple PRPG seeds. ITC Peter Wohl, John A. Waicukauski, Sanjay Patel, Francisco DaSilva, Thomas W. Williams, Rohit Kapur
2005	Misc	`conf`	Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST. VTS Peter Wohl, John A. Waicukauski, Sanjay Patel, Cy Hay, Emil Gizdarski, Ben Mathew
2004	A*	`conf`	Scalable selector architecture for x-tolerant deterministic BIST. DAC Peter Wohl, John A. Waicukauski, Sanjay Patel
2003	A*	`conf`	Efficient compression and application of deterministic patterns in a logic BIST architecture. DAC Peter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin
2003	A	`conf`	X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST Architecture. ITC Peter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin
2002	A*	`conf`	Effective diagnostics through interval unloads in a BIST environment. DAC Peter Wohl, John A. Waicukauski, Sanjay Patel, Gregory A. Maston
2002	A	`conf`	Scan Test Data Volume Reduction in Multi-Clocked Designs with Safe Capture Technique. ITC Vishal Jain, John A. Waicukauski
2001	A	`conf`	Design of compactors for signature-analyzers in built-in self-test. ITC Peter Wohl, John A. Waicukauski, Thomas W. Williams
2000	A	`conf`	Optimizing the flattened test-generation model for very large designs. ITC Peter Wohl, John A. Waicukauski
1999	A	`conf`	Using Verilog simulation libraries for ATPG. ITC Peter Wohl, John A. Waicukauski
1998	A	`conf`	Defining ATPG rules checking in STIL. ITC Peter Wohl, John A. Waicukauski
1998	A	`conf`	Extracting gate-level networks from simulation tables. ITC Peter Wohl, John A. Waicukauski
1997	A	`conf`	A Unified Interface for Scan Test Generation Based on STIL. ITC Peter Wohl, John A. Waicukauski
1997	Misc	`conf`	Using ATPG for clock rules checking in complex scan design. VTS Peter Wohl, John A. Waicukauski
1996	A	`conf`	A Universal Technique for Accelerating Simulation of Scan Test Patterns. ITC Bejoy G. Oomman, Wu-Tung Cheng, John A. Waicukauski
1996	A	`conf`	Test Generation for Ultra-Large Circuits Using ATPG Constraints and Test-Pattern Templates. ITC Peter Wohl, John A. Waicukauski
1996	Misc	`conf`	Testing "untestable" faults in three-state circuits. VTS Peter Wohl, John A. Waicukauski, Matthew Graf
1996	A	`conf`	Two-Dimensional Test Data Decompressor for Multiple Scan Designs. ITC Nadime Zacharia, Janusz Rajski, Jerzy Tyszer, John A. Waicukauski
1990	A	`conf`	ATPG for ultra-large structured designs. ITC John A. Waicukauski, Paul A. Shupe, David Giramma, Arshad Matin
1990	J	`jnl`	On computing the sizes of detected delay faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Vijay S. Iyengar, Barry K. Rosen, John A. Waicukauski
1989	J	`jnl`	A Method for Generating Weighted Random Test Patterns. IBM J. Res. Dev. John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Orazio P. Forlenza
1989	J	`jnl`	Failure diagnosis of structured VLSI. IEEE Des. Test John A. Waicukauski, Eric Lindbloom
1988	A	`conf`	Fault Detection Effectiveness of Weighted Random Patterns. ITC John A. Waicukauski, Eric Lindbloom
1988	A	`conf`	What is the Path to Fast Fault Simulation? ITC Miron Abramovici, Balaji Krishnamurthy, Rob Mathews, Bill Rogers, Michael Schulz, Sharad Seth, John A. Waicukauski
1987	J	`jnl`	Transition Fault Simulation. IEEE Des. Test John A. Waicukauski, Eric Lindbloom, Barry K. Rosen, Vijay S. Iyengar
1986	A	`conf`	Transition Fault Simulation by Parallel Pattern Single Fault Propagation. ITC John A. Waicukauski, Eric Lindbloom, Vijay S. Iyengar, Barry K. Rosen
1985	A	`conf`	A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation. ITC John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Donato O. Forlenza, Tim McCarthy
1983	A	`conf`	An LSSD Pseudo Random Pattern Test System. ITC Franco Motika, John A. Waicukauski, Edward B. Eichelberger, Eric Lindbloom
1981	A	`conf`	Fault Diagnosis in an LSSD Environment. ITC Y. Arzoumanian, John A. Waicukauski