Joe Swenton - RankMe

11 papers A 3B 2Journal 2Unranked 4

Year	Rank	Type	Title / Venue / Authors
2024	J	`jnl`	Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology. IEEE Des. Test Zhan Gao, Min-Chun Hu, Rogier Baert, Bilal Chehab, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen
2021	J	`jnl`	Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality. J. Electron. Test. Zhan Gao, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Erik Jan Marinissen
2021	B	`conf`	Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis. ETS Francesco Lorenzelli, Zhan Gao, Joe Swenton, Santosh Malagi, Erik Jan Marinissen
2020	B	`conf`	Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults. ETS Min-Chun Hu, Zhan Gao, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Cheng-Wen Wu, Erik Jan Marinissen
2019	A	`conf`	Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library. ITC Zhan Gao, Santosh Malagi, Min-Chun Hu, Joe Swenton, Rogier Baert, Jos Huisken, Bilal Chehab, Kees Goossens, Erik Jan Marinissen
2019	—	`conf`	Defect-Location Identification for Cell-Aware Test. LATS Zhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos Huisken, Kees Goossens
2019	—	`conf`	Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices. ITC-Asia Zhan Gao, Min-Chun Hu, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen
2018	A	`conf`	Improving Diagnosis Resolution and Performance at High Compression Ratios. ITC Sameer Chillarige, Atul Chhabra, Anil Malik, Bharath Nandakumar, Joe Swenton, Krishna Chakravadhanula
2017	A	`conf`	High throughput multiple device diagnosis system. ITC Sameer Chillarige, Anil Malik, Sharjinder Singh, Joe Swenton, Krishna Chakravadhanula
2015	—	`conf`	A Novel Failure Diagnosis Approach for Low Pin Count and Low Power Compression Architectures. NATW Sameer Chillarige, S. Virdi, Anil Malik, Krishna Chakravadhanula, Vivek Chickermane, Joe Swenton, G. Vandling
1999	—	`conf`	A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor. Asian Test Symposium Xinghao Chen, Thomas J. Snethen, Joe Swenton, Ron Walther