| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | A | conf |
DATE
|
| 2021 | C | conf |
ICMLA
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2019 | Misc | conf |
VTS
|
| 2018 | Misc | conf |
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver.
VTS
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2010 | — | conf |
LATW
|
| 2010 | B | conf |
ETS
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2007 | — | conf |
ATS
|
| 2007 | — | conf |
ATS
|
| 2006 | A | conf |
ITC
|
| 2006 | — | conf |
ATS
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2002 | Misc | conf |
VTS
|
| 2002 | Misc | conf |
VTS
|
| 2001 | A | conf |
ITC
|
| 2001 | A | conf |
ITC
|