| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Appl. Soft Comput.
|
| 2025 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2024 | B | conf |
CEC
|
| 2024 | J | jnl |
IEEE Trans. Geosci. Remote. Sens.
|
| 2024 | J | jnl |
IEEE Trans. Geosci. Remote. Sens.
|
| 2024 | J | jnl |
Microelectron. J.
|
| 2024 | J | jnl |
IEEE J. Biomed. Health Informatics
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2023 | — | conf |
DMBD (1)
|
| 2023 | — | conf |
MSN
|
| 2023 | — | conf |
DMBD (2)
|
| 2023 | — | conf |
APNet
|
| 2023 | A* | conf |
DAC
|
| 2023 | J | jnl |
Health Inf. Sci. Syst.
|
| 2023 | — | conf |
ICMRE
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
IEEE Robotics Autom. Lett.
|
| 2023 | J | jnl |
Sensors
|
| 2023 | — | conf |
MSN
|
| 2023 | J | jnl |
J. Intell. Fuzzy Syst.
|
| 2023 | — | conf |
BIGCOM
|
| 2022 | — | conf |
MSN
|
| 2022 | J | jnl |
Comput. Ind. Eng.
|
| 2022 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2022 | J | jnl |
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
Entropy
|
| 2022 | J | jnl |
Knowl. Based Syst.
|
| 2021 | J | jnl |
Complex.
|
| 2021 | J | jnl |
Neurocomputing
|
| 2021 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2020 | J | jnl |
Neural Networks
|
| 2020 | J | jnl |
Signal Image Video Process.
|
| 2020 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Knowl. Based Syst.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Signal Process.
|
| 2020 | J | jnl |
Semisupervised Feature Extraction Based on Collaborative Label Propagation for Hyperspectral Images.
IEEE Geosci. Remote. Sens. Lett.
|
| 2020 | J | jnl |
J. Intell. Fuzzy Syst.
|
| 2019 | J | jnl |
IEEE Trans. Neural Networks Learn. Syst.
|
| 2019 | J | jnl |
Signal Process.
|
| 2019 | J | jnl |
Neurocomputing
|
| 2018 | J | jnl |
Int. J. Distributed Sens. Networks
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Int. J. Mach. Learn. Cybern.
|
| 2017 | — | conf |
ICPCSEE (1)
|
| 2017 | J | jnl |
Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor.
Sci. China Inf. Sci.
|
| 2016 | J | jnl |
Int. J. Appl. Earth Obs. Geoinformation
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Int. J. Comput. Intell. Syst.
|
| 2012 | J | jnl |
J. Networks
|
| 2008 | — | conf |
ICAIT
|