| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | A | conf |
CIKM
|
| 2025 | J | jnl |
CoRR
|
| 2025 | A* | conf |
CVPR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | A* | conf |
ICRA
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2024 | — | conf |
CAI
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
VLSI Technology and Circuits
|
| 2024 | A* | conf |
NeurIPS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
ECCV (48)
|
| 2024 | J | jnl |
Syst.
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Trans. Intell. Veh.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2021 | A* | conf |
ICCV
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
BCI
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | — | conf |
ECCV (12)
|
| 2020 | J | jnl |
CoRR
|
| 2020 | B | conf |
ICNP
|
| 2020 | — | conf |
ICPHM
|
| 2019 | J | jnl |
Symmetry
|
| 2019 | J | jnl |
Entropy
|
| 2019 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | A | conf |
INTERSPEECH
|
| 2017 | J | jnl |
A digital technique for diagnosing interconnect degradation by using digital signal characteristics.
Microelectron. J.
|
| 2015 | — | conf |
ASCC
|
| 2015 | — | conf |
PSIVT Workshops
|
| 2015 | J | jnl |
EURO J. Transp. Logist.
|
| 2014 | — | conf |
ISSCC
|
| 2014 | — | conf |
URAI
|
| 2013 | — | conf |
ISR
|
| 2013 | J | jnl |
SIAM J. Numer. Anal.
|
| 2012 | C | conf |
IECON
|
| 2009 | — | conf |
NEMS
|
| 2008 | J | jnl |
J. Comput. Chem.
|
| 2006 | J | jnl |
SIAM J. Numer. Anal.
|
| 2005 | J | jnl |
J. Syst. Softw.
|
| 2004 | J | jnl |
IACR Cryptol. ePrint Arch.
|