| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | — | conf |
ICICDT
|
| 2022 | J | jnl |
Sci. China Inf. Sci.
|
| 2022 | J | jnl |
Neuromorph. Comput. Eng.
|
| 2021 | J | jnl |
Sci. China Inf. Sci.
|
| 2020 | J | jnl |
Sensors
|
| 2020 | J | jnl |
Sensors
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Sci. China Inf. Sci.
|
| 2019 | — | conf |
ICICDT
|
| 2019 | J | jnl |
Sci. China Inf. Sci.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2017 | — | conf |
A-SSCC
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Sci. China Inf. Sci.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
J. Electron. Test.
|
| 2014 | J | jnl |
J. Electron. Test.
|