| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | A | conf |
ITC
|
| 2025 | — | conf |
AICAS
|
| 2025 | — | conf |
ITC-Asia
|
| 2025 | A | conf |
ITC
|
| 2025 | A | conf |
ICCAD
|
| 2025 | A | conf |
ITC
|
| 2025 | — | conf |
ATS
|
| 2023 | — | conf |
SOCC
|
| 2023 | C | conf |
ICCD
|
| 2023 | — | conf |
ATS
|
| 2022 | — | conf |
VLSI-DAT
|
| 2022 | — | conf |
ATS
|
| 2022 | — | conf |
AICAS
|
| 2022 | — | conf |
ATS
|
| 2022 | A | conf |
ITC
|
| 2021 | A | conf |
ITC
|
| 2021 | — | conf |
ATS
|
| 2021 | — | conf |
AICAS
|
| 2020 | — | conf |
ATS
|
| 2019 | A | conf |
FPGA
|
| 2019 | — | conf |
NNSim: A Fast and Accurate SystemC/TLM Simulator for Deep Convolutional Neural Network Accelerators.
VLSI-DAT
|
| 2017 | — | conf |
VLSI-DAT
|
| 2017 | — | conf |
VLSI-DAT
|
| 2017 | — | conf |
ATS
|
| 2015 | — | conf |
ASP-DAC
|
| 2015 | C | conf |
VLSI-SoC
|
| 2015 | — | conf |
ASP-DAC
|
| 2015 | J | jnl |
IEEE Trans. Multim.
|
| 2014 | C | conf |
Chip clustering with mutual information on multiple clock tests and its application to yield tuning.
ICCD
|
| 2014 | — | conf |
SoCC
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2013 | — | conf |
MES
|
| 2012 | — | conf |
APSIPA
|
| 2012 | — | conf |
ASP-DAC
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2011 | A* | conf |
DAC
|
| 2011 | — | conf |
Diagnosis-assisted supply voltage configuration to increase performance yield of cell-based designs.
ASP-DAC
|
| 2011 | J | jnl |
J. Circuits Syst. Comput.
|
| 2011 | — | conf |
ASP-DAC
|
| 2010 | — | conf |
DFT
|
| 2010 | J | jnl |
IEEE Des. Test Comput.
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2008 | — | conf |
Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques.
ATS
|
| 2008 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2008 | — | conf |
ATS
|
| 2007 | — | conf |
SoCC
|
| 2007 | A | conf |
ITC
|
| 2007 | J | jnl |
IET Comput. Digit. Tech.
|
| 2007 | A* | conf |
DAC
|
| 2007 | Misc | conf |
VTS
|
| 2006 | — | conf |
DFT
|
| 2006 | A | conf |
ICCAD
|
| 2005 | Misc | conf |
VTS
|
| 2005 | A | conf |
ITC
|
| 2004 | — | conf |
DFT
|
| 2004 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2003 | A | conf |
DATE
|
| 2003 | Misc | conf |
VTS
|
| 2003 | A* | conf |
DAC
|
| 2003 | — | conf |
ASP-DAC
|
| 2003 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | — | conf |
ISQED
|
| 2002 | A | conf |
ITC
|
| 2002 | A* | conf |
DAC
|
| 2002 | A* | conf |
DAC
|
| 2002 | A | conf |
ICCAD
|
| 2001 | A | conf |
ITC
|
| 2001 | A* | conf |
DAC
|
| 2000 | A | conf |
ICCAD
|
| 2000 | Misc | conf |
VTS
|
| 2000 | — | conf |
ASP-DAC
|