Jin Wang

22 papers C 15Journal 6Unranked 1
YearRankTypeTitle / Venue / Authors
2025 C conf
Statistical Process Monitoring of Cryogenic Air Separation Unit Startups.
ACC
Bahareh Hassani, Yajun Wang, Ankur Kumar, Jesus Flores-Cerrillo, Jin Wang, Q. Peter He
2022 C conf
Understanding the evolution of interspecies metabolic interactions using dynamic genome-scale metabolic modeling
ACC
Kiumars Badr, Q. Peter He, Jin Wang
2020 C conf
A Variable Selection Method for Improving Variable Selection Consistency and Soft Sensor Performance.
ACC
Jangwon Lee, Jesus Flores-Cerrillo, Jin Wang, Q. Peter He
2020 J jnl
Bridging systems theory and data science: A unifying review of dynamic latent variable analytics and process monitoring.
Annu. Rev. Control.
Si-Zhao Joe Qin, Yining Dong, Qinqin Zhu, Jin Wang, Qiang Liu
2020 J jnl
Feature engineering in big data analytics for IoT-enabled smart manufacturing - Comparison between deep learning and statistical learning.
Comput. Chem. Eng.
Devarshi Shah, Jin Wang, Q. Peter He
2020 C conf
Using Channel State Information for Estimating Moisture Content in Woodchips via 5 GHz Wi-Fi.
ACC
Kerul Suthar, Jin Wang, Zhihua Jiang, Q. Peter He
2019 J jnl
Feature space monitoring for smart manufacturing via statistics pattern analysis.
Comput. Chem. Eng.
Q. Peter He, Jin Wang, Devarshi Shah
2019 J jnl
Next-generation virtual metrology for semiconductor manufacturing: A feature-based framework.
Comput. Chem. Eng.
Kerul Suthar, Devarshi Shah, Jin Wang, Q. Peter He
2017 C conf
A new application of data-driven soft sensor: Estimating individual biomass in mixed cultures.
ACC
Kyle A. Stone, Devarshi Shah, Q. Peter He, Jin Wang
2017 C conf
Statistical process monitoring in the era of smart manufacturing.
ACC
Q. Peter He, Jin Wang
2013 C conf
Elucidating xylose metabolism of scheffersomyces stipitis by integrating principal component analysis with flux balance analysis.
ACC
Meng Liang, Q. Peter He, Thomas W. Jeffries, Jin Wang
2013 C conf
Improved state estimation for high-mix semiconductor manufacturing.
ACC
Jin Wang, Q. Peter He, Thomas F. Edgar
2013 C conf
Quantification of valve stiction based on a semi-physical model.
ACC
Q. Peter He, Jin Wang
2012 C conf
Statistics pattern analysis based virtual metrology for plasma etch processes.
ACC
Q. Peter He, Jin Wang, Hector E. Gilicia, John D. Stuber, Bhalinder S. Gill
2010 C conf
Comparison of a new spectrum alignment algorithm with other methods.
ACC
Q. Peter He, Jin Wang
2010 C conf
Control performance assessment and diagnosis for semiconductor processes.
ACC
Jin Wang, Q. Peter He, Thomas F. Edgar
2008 C conf
EWMA run-to-run controllers with gain updating: Stability and sensitivity analysis.
ACC
Jin Wang, Q. Peter He
2008 C conf
Principal component based k-nearest-neighbor rule for semiconductor process fault detection.
ACC
Q. Peter He, Jin Wang
2007 C conf
A General Framework for State Estimation in High-Mix Semiconductor Manufacturing.
ACC
Jin Wang, Q. Peter He, Thomas F. Edgar
2007 J jnl
Run-to-run control and state estimation in high-mix semiconductor manufacturing.
Annu. Rev. Control.
Christopher A. Bode, Jin Wang, Q. Peter He, Thomas F. Edgar
2006 J jnl
Closed-loop subspace identification using the parity space.
Autom.
Jin Wang, Si-Zhao Joe Qin
2001 — conf
Principal component analysis for errors-in-variables subspace identification.
CDC
Jin Wang, S. Joe Qin