| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
ATS
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | B | conf |
ETS
|
| 2025 | — | conf |
DFT
|
| 2024 | A | conf |
ITC
|
| 2024 | B | conf |
ETS
|
| 2024 | — | conf |
DFT
|
| 2023 | — | conf |
ASP-DAC
|
| 2023 | — | conf |
ITC-Asia
|
| 2023 | — | conf |
DFT
|
| 2023 | — | conf |
DFT
|
| 2022 | A | conf |
ITC
|
| 2022 | — | conf |
ISOCC
|
| 2022 | — | conf |
ISOCC
|
| 2022 | — | conf |
ITC-Asia
|
| 2022 | — | conf |
ATS
|
| 2022 | — | conf |
ITC-Asia
|
| 2021 | — | conf |
DFT
|
| 2021 | — | conf |
SoCC
|
| 2020 | — | conf |
ITC-Asia
|
| 2020 | — | conf |
ATS
|
| 2019 | — | conf |
3DIC
|
| 2019 | — | conf |
3DIC
|
| 2019 | — | conf |
DFT
|
| 2019 | — | conf |
ASP-DAC
|
| 2018 | — | conf |
ASP-DAC
|
| 2018 | J | jnl |
IEEE Des. Test
|
| 2018 | — | conf |
ISOCC
|
| 2018 | B | conf |
ETS
|
| 2017 | B | conf |
ETS
|
| 2017 | — | conf |
ITC-Asia
|
| 2016 | — | conf |
ATS
|
| 2016 | B | conf |
ETS
|
| 2016 | A | conf |
ITC
|
| 2016 | Misc | conf |
VTS
|
| 2015 | — | conf |
VLSI-DAT
|
| 2015 | Misc | conf |
VTS
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | — | conf |
ATS
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | — | conf |
ATS
|
| 2014 | — | conf |
ATS
|
| 2014 | J | jnl |
J. Electron. Test.
|
| 2014 | — | conf |
ATS
|
| 2014 | A | conf |
ICCAD
|
| 2014 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | J | jnl |
J. Inf. Sci. Eng.
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | Misc | conf |
VTS
|
| 2013 | Misc | conf |
VTS
|
| 2013 | — | conf |
VLSI-DAT
|
| 2013 | Misc | conf |
VTS
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | A | conf |
ITC
|
| 2012 | — | conf |
VLSI-DAT
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | B | conf |
ETS
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | — | conf |
ASP-DAC
|
| 2012 | — | conf |
VLSI-DAT
|
| 2012 | Misc | conf |
VTS
|
| 2012 | J | jnl |
IEEE Trans. Computers
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | Misc | conf |
VTS
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | J | jnl |
J. Inf. Sci. Eng.
|
| 2010 | J | jnl |
IEEE Des. Test Comput.
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | B | conf |
ETS
|
| 2010 | B | conf |
ETS
|
| 2010 | Misc | conf |
VTS
|
| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2010 | — | conf |
SoCC
|
| 2010 | — | conf |
ASP-DAC
|
| 2010 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2010 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2010 | — | conf |
DELTA
|
| 2010 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2009 | C | conf |
ISCAS
|
| 2009 | — | conf |
ISQED
|
| 2009 | J | jnl |
IEEE Micro
|
| 2009 | Misc | conf |
VTS
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2008 | J | jnl |
J. Electron. Test.
|
| 2008 | — | conf |
ATS
|
| 2008 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2008 | A | conf |
ITC
|
| 2007 | Misc | conf |
VTS
|
| 2007 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2007 | J | jnl |
CoRR
|
| 2007 | — | conf |
ATS
|
| 2007 | — | conf |
SoCC
|
| 2007 | — | conf |
SoCC
|
| 2007 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | — | conf |
ATS
|
| 2007 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2007 | J | jnl |
IET Comput. Digit. Tech.
|
| 2007 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | — | conf |
DFT
|
| 2006 | A | conf |
ITC
|
| 2006 | A | conf |
DATE
|
| 2006 | B | conf |
ETS
|
| 2006 | — | conf |
ATS
|
| 2005 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | — | conf |
ISCAS (1)
|
| 2005 | A | conf |
DATE
|
| 2005 | — | conf |
MTDT
|
| 2005 | Misc | conf |
VTS
|
| 2005 | — | conf |
ASP-DAC
|
| 2005 | A | conf |
ITC
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2003 | A | conf |
ITC
|
| 2003 | — | conf |
MTDT
|
| 2003 | J | jnl |
IEEE Trans. Reliab.
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | J | jnl |
IEEE Micro
|
| 2002 | A | conf |
DATE
|
| 2002 | — | conf |
IOLTW
|
| 2002 | — | conf |
MTDT
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2002 | Misc | conf |
VTS
|
| 2001 | A | conf |
ITC
|
| 2001 | A | conf |
DATE
|
| 2000 | — | conf |
Asian Test Symposium
|
| 1999 | — | conf |
DFT
|