| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEICE Electron. Express
|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
IEICE Electron. Express
|
| 2022 | — | conf |
Design of SEL Self-Recovery Hardness for 90nm COTS Devices Using R-C-S Network with DC-DC Converter.
APCCAS
|
| 2022 | J | jnl |
Symmetry
|
| 2022 | J | jnl |
J. Interconnect. Networks
|
| 2022 | J | jnl |
J. Interconnect. Networks
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEICE Electron. Express
|
| 2020 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
Sci. China Inf. Sci.
|
| 2014 | J | jnl |
Sci. China Inf. Sci.
|
| 2014 | J | jnl |
Comput. Graph.
|
| 2008 | J | jnl |
ACM Trans. Graph.
|
| 2006 | J | jnl |
Vis. Comput.
|