| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Engineering Management
|
| 2026 | J | jnl |
Comput. Speech Lang.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | C | conf |
CSCWD
|
| 2025 | J | jnl |
CoRR
|
| 2025 | C | conf |
CSCWD
|
| 2025 | J | jnl |
IET Image Process.
|
| 2025 | C | conf |
CSCWD
|
| 2025 | J | jnl |
IET Image Process.
|
| 2025 | J | jnl |
IEEE CAA J. Autom. Sinica
|
| 2025 | J | jnl |
Manag. Sci.
|
| 2025 | B | conf |
SMC
|
| 2025 | — | conf |
MMAsia
|
| 2025 | J | jnl |
Signal Image Video Process.
|
| 2024 | C | conf |
CSCWD
|
| 2024 | J | jnl |
Comput. Biol. Chem.
|
| 2024 | B | conf |
ICPADS
|
| 2024 | J | jnl |
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
|
| 2024 | B | conf |
SMC
|
| 2024 | J | jnl |
Algorithms
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
Remote. Sens.
|
| 2024 | — | conf |
CISP-BMEI
|
| 2024 | — | conf |
EITCE
|
| 2024 | J | jnl |
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
|
| 2024 | C | conf |
CSCWD
|
| 2024 | B | conf |
SMC
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
Electron. Commer. Res.
|
| 2023 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2023 | J | jnl |
Electron. Commer. Res.
|
| 2023 | B | conf |
SMC
|
| 2023 | J | jnl |
Ann. Oper. Res.
|
| 2023 | — | conf |
MMAsia
|
| 2022 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2022 | — | conf |
BCB
|
| 2022 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2021 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2021 | J | jnl |
Manag. Sci.
|
| 2021 | — | conf |
ICDTE
|
| 2021 | J | jnl |
Database J. Biol. Databases Curation
|
| 2021 | J | jnl |
J. Intell. Robotic Syst.
|
| 2020 | J | jnl |
Int. J. Prod. Res.
|
| 2020 | J | jnl |
Sensors
|
| 2020 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2019 | J | jnl |
Eur. J. Oper. Res.
|
| 2019 | J | jnl |
IEEE Access
|
| 2016 | J | jnl |
Inf. Econ. Policy
|
| 2016 | J | jnl |
Eur. J. Oper. Res.
|
| 2015 | — | conf |
NGMAST
|
| 2013 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2012 | J | jnl |
J. Electron. Commer. Organ.
|
| 2010 | — | conf |
IALP
|
| 2003 | B | conf |
PIMRC
|