| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
Pattern Recognit.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
ACM Trans. Knowl. Discov. Data
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2023 | J | jnl |
Sensors
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Sensors
|
| 2023 | J | jnl |
Sensors
|
| 2023 | A* | conf |
CVPR
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
Signal Image Video Process.
|
| 2021 | J | jnl |
J. Robotics
|
| 2021 | J | jnl |
Comput. Intell. Neurosci.
|
| 2021 | J | jnl |
Remote. Sens.
|
| 2020 | — | conf |
EuroSec@EuroSys
|
| 2020 | J | jnl |
FIT: Inspect vulnerabilities in cross-architecture firmware by deep learning and bipartite matching.
Comput. Secur.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
IHSED
|
| 2018 | — | conf |
PHOTOPTICS
|
| 2017 | — | conf |
5GWN
|
| 2015 | J | jnl |
Sensors
|
| 2013 | — | conf |
ICDIP
|
| 2011 | — | conf |
ICDIP
|
| 2010 | — | conf |
FSKD
|
| 2010 | J | jnl |
Math. Soc. Sci.
|
| 2008 | J | jnl |
J. Complex.
|
| 2006 | — | conf |
ECOWS
|