| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
WF-IoT
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | — | conf |
WF-IoT
|
| 2025 | J | jnl |
IEEE Control. Syst. Lett.
|
| 2025 | J | jnl |
Frontiers Robotics AI
|
| 2025 | J | jnl |
Adv. Intell. Syst.
|
| 2025 | J | jnl |
IEEE Trans. Intell. Veh.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE J. Solid State Circuits
|
| 2024 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2024 | J | jnl |
Dual-Orientation Fusion of Dual-Frequency Ultrashort Ultrasound Pulses for Super-Resolution Imaging.
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | — | conf |
ISSCC
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Commun. Mag.
|
| 2021 | J | jnl |
Signal Process.
|
| 2021 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2020 | C | conf |
ICCC
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | — | conf |
IST
|
| 2018 | J | jnl |
Sensors
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2016 | J | jnl |
IEEE Trans. Biomed. Eng.
|
| 2016 | J | jnl |
J. Adv. Comput. Intell. Intell. Informatics
|
| 2016 | J | jnl |
IEICE Electron. Express
|
| 2016 | J | jnl |
IEICE Electron. Express
|
| 2016 | J | jnl |
IEICE Electron. Express
|
| 2015 | — | conf |
iCAST
|
| 2015 | J | jnl |
Proc. IEEE
|
| 2015 | — | conf |
ASICON
|
| 2015 | J | jnl |
Wirel. Pers. Commun.
|
| 2014 | J | jnl |
Sensors
|
| 2013 | J | jnl |
Wirel. Pers. Commun.
|
| 2013 | J | jnl |
J. Circuits Syst. Comput.
|
| 2013 | J | jnl |
J. Circuits Syst. Comput.
|
| 2013 | J | jnl |
J. Circuits Syst. Comput.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Comput. Methods Programs Biomed.
|
| 2012 | J | jnl |
Comput. Methods Programs Biomed.
|
| 2012 | — | conf |
FPT
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
IEICE Electron. Express
|
| 2009 | — | conf |
PACCS
|
| 2008 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2008 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2008 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2007 | — | conf |
ICNS
|
| 2007 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2007 | J | jnl |
Microelectron. J.
|
| 2006 | C | conf |
ISCAS
|
| 2006 | — | conf |
AMT
|
| 2006 | C | conf |
VLSI-SoC
|
| 2006 | — | conf |
APCCAS
|
| 2006 | Misc | conf |
VLSI Design
|
| 2006 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2006 | J | jnl |
J. Circuits Syst. Comput.
|
| 2005 | — | conf |
SoCC
|
| 2005 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2005 | — | conf |
ISCAS (5)
|
| 2005 | — | conf |
ISCAS (1)
|
| 2005 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2005 | — | conf |
ISCAS (1)
|
| 2004 | C | conf |
PDCAT
|
| 2004 | — | conf |
SLIP
|
| 2004 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2003 | — | conf |
IWSOC
|