| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
IEEE Wirel. Commun. Lett.
|
| 2025 | A* | conf |
ICML
|
| 2025 | Misc | conf |
ICASSP
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | A | conf |
CIKM
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Computers
|
| 2024 | — | conf |
EMC Compo
|
| 2024 | — | conf |
EMC Compo
|
| 2024 | J | jnl |
Remote. Sens.
|
| 2023 | J | jnl |
Proc. VLDB Endow.
|
| 2023 | J | jnl |
Inf.
|
| 2023 | J | jnl |
Remote. Sens.
|
| 2023 | J | jnl |
Remote. Sens.
|
| 2022 | — | conf |
ICCCS
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | — | conf |
ICMECG
|
| 2021 | J | jnl |
J. Circuits Syst. Comput.
|
| 2019 | — | conf |
EUSIPCO
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2017 | — | conf |
ICSPCC
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
ASICON
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2014 | J | jnl |
J. Multim.
|
| 2013 | — | conf |
EMC Compo
|
| 2013 | — | conf |
ESSCIRC
|
| 2013 | — | conf |
NCCET
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | — | conf |
EMC Compo
|
| 2011 | J | jnl |
Data Knowl. Eng.
|
| 2011 | — | conf |
SSIRI
|
| 2010 | C | conf |
ICMLA
|
| 2009 | J | jnl |
Knowl. Inf. Syst.
|
| 2009 | — | conf |
ICDM Workshops
|
| 2008 | J | jnl |
BMC Bioinform.
|