| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Inf. Sci.
|
| 2026 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2026 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2026 | J | jnl |
Pattern Recognit.
|
| 2025 | J | jnl |
IEEE Trans. Neural Networks Learn. Syst.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Signal Process. Lett.
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2024 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | C | conf |
IECON
|
| 2023 | J | jnl |
Mach. Learn. Knowl. Extr.
|
| 2022 | C | conf |
IECON
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2022 | J | jnl |
IEEE Trans. Cybern.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | — | conf |
Study of the Predictive Mechanism with Big Data-Driven Lean Manufacturing and Six Sigma Methodology.
APMS (4)
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
Sensors
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
Entropy
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
Entropy
|
| 2019 | — | conf |
ISIE
|
| 2018 | C | conf |
IECON
|
| 2018 | C | conf |
IECON
|
| 2017 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2017 | J | jnl |
Complex.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | C | conf |
FUSION
|
| 2012 | — | conf |
ISIE
|
| 2012 | — | conf |
ISIE
|
| 2011 | C | conf |
FUSION
|
| 2011 | — | conf |
AICI (3)
|
| 2010 | — | conf |
IITSI
|
| 2009 | — | conf |
ETT
|
| 2009 | J | jnl |
J. Signal Process. Syst.
|
| 2009 | B | conf |
RTCSA
|
| 2008 | Misc | conf |
ISKE
|
| 2008 | — | conf |
EUC (1)
|
| 2008 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2008 | — | conf |
CSE
|
| 2008 | B | conf |
FPL
|
| 2008 | — | conf |
PDCCS
|