| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Reliab.
|
| 2026 | J | jnl |
Autom.
|
| 2025 | J | jnl |
IEEE Internet Things J.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2025 | J | jnl |
Syst. Control. Lett.
|
| 2025 | J | jnl |
Syst. Control. Lett.
|
| 2024 | J | jnl |
IEEE Control. Syst. Lett.
|
| 2024 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2023 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
J. Frankl. Inst.
|
| 2022 | J | jnl |
Knowl. Based Syst.
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2020 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2019 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | — | conf |
IEEM
|
| 2017 | J | jnl |
IEEE Trans. Reliab.
|
| 2017 | J | jnl |
Reliability Demonstration for Long-Life Products Based on Hardened Testing Method and Gamma Process.
IEEE Access
|
| 2016 | J | jnl |
Frontiers Comput. Sci.
|
| 2012 | — | conf |
AsiaSim (1)
|
| 2011 | J | jnl |
Pattern Recognit.
|
| 2010 | J | jnl |
Neural Process. Lett.
|
| 2010 | Misc | conf |
SAC
|
| 2010 | Misc | conf |
ICNC
|
| 1994 | — | conf |
CASCON
|
| 1992 | — | conf |
CASCON
|