| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Pattern Recognit.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Signal Process.
|
| 2022 | J | jnl |
Depth Estimation From a Single Image of Blast Furnace Burden Surface Based on Edge Defocus Tracking.
IEEE Trans. Circuits Syst. Video Technol.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | — | conf |
CAA SAFEPROCESS
|
| 2020 | J | jnl |
Sensors
|
| 2012 | J | jnl |
J. Appl. Math.
|