| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Smart Grid
|
| 2025 | J | jnl |
A Mesh Is Worth 512 Numbers: Spectral-domain Diffusion Modeling for High-dimension Shape Generation.
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Ann. Oper. Res.
|
| 2024 | — | conf |
CAI
|
| 2024 | — | conf |
ECCV (78)
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Expert Syst. Appl.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
IEEE Access
|
| 2015 | — | conf |
ICIA
|
| 2015 | J | jnl |
Expert Syst. Appl.
|
| 2014 | J | jnl |
Reliab. Eng. Syst. Saf.
|