Jerry M. Soden

26 papers A 16Misc 1Journal 9

Year	Rank	Type	Title / Venue / Authors
2002	A	`conf`	Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. ITC Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura
2002	A	`conf`	Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins
2001	Misc	`conf`	Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. VTS Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden
1999	J	`jnl`	Deep Submicron CMOS Current IC Testing: Is There a Future? IEEE Des. Test Comput. Charles F. Hawkins, Jerry M. Soden
1999	J	`jnl`	Test and Reliability: Partners in IC Manufacturing, Part 2. IEEE Des. Test Comput. Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin
1998	A	`conf`	CMOS IC reliability indicators and burn-in economics. ITC Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell
1997	A	`conf`	IC Diagnosis: Industry Issues. ITC Jerry M. Soden, Christopher L. Henderson
1997	J	`jnl`	IC Failure Analysis: Magic, Mystery, and Science. IEEE Des. Test Comput. Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
1997	A	`conf`	Signature Analysis for IC Diagnosis and Failure Analysis. ITC Christopher L. Henderson, Jerry M. Soden
1997	J	`jnl`	Still in the Stone Age? IEEE Des. Test Comput. Jerry M. Soden, Christopher L. Henderson
1997	A	`conf`	Transient Power Supply Voltage (V ITC Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins
1996	A	`conf`	High Resolution I ITC Alan W. Righter, Jerry M. Soden, Richard W. Beegle
1996	A	`conf`	IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. ITC Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
1996	J	`jnl`	IDDQ Testing: Issues Present and Future. IEEE Des. Test Comput. Jerry M. Soden, Charles F. Hawkins
1995	J	`jnl`	IDDQ Design and Test Advantages Propel Industry. IEEE Des. Test Comput. Charles F. Hawkins, Jerry M. Soden
1994	A	`conf`	Defect Classes - An Overdue Paradigm for CMOS IC. ITC Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson
1993	J	`jnl`	IC failure analysis: techniques and tools for quality reliability improvement. Proc. IEEE Jerry M. Soden, Richard E. Anderson
1993	A	`conf`	Quality Testing Requires Quality Thinking. ITC Jerry M. Soden, Charles F. Hawkins
1992	J	`jnl`	IDDQ testing: A review. J. Electron. Test. Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao
1991	A	`conf`	The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. ITC Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins
1990	A	`conf`	Increased CMOS IC stuck-at fault coverage with reduced I ITC Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins
1990	A	`conf`	Zero defects or zero stuck-at faults-CMOS IC process improvement with I ITC Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins
1989	A	`conf`	CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. ITC Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins
1986	A	`conf`	Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. ITC Jerry M. Soden, Charles F. Hawkins
1986	J	`jnl`	Test Considerations for Gate Oxide Shorts in CMOS ICs. IEEE Des. Test Jerry M. Soden, Charles F. Hawkins
1985	A	`conf`	Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. ITC Jerry M. Soden, Charles F. Hawkins