| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Empir. Softw. Eng.
|
| 2025 | A* | conf |
ASE
|
| 2025 | J | jnl |
CoRR
|
| 2025 | A | conf |
ICSME
|
| 2025 | A | conf |
ICSME
|
| 2025 | J | jnl |
CoRR
|
| 2025 | A | conf |
MSR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | A | conf |
ICSME
|
| 2025 | A | conf |
ICST
|
| 2024 | — | conf |
SCORED@CCS
|
| 2024 | A | conf |
MSR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | C | conf |
SCAM
|
| 2024 | A | conf |
MSR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
SCORED@CCS
|
| 2024 | J | jnl |
Proc. ACM Softw. Eng.
|
| 2023 | A* | conf |
ICDE
|
| 2023 | A | conf |
ECOOP
|
| 2023 | — | conf |
FairWare
|
| 2023 | C | conf |
AST
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
J. Syst. Softw.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | A | conf |
ISSTA
|
| 2023 | A | conf |
SANER
|
| 2022 | J | jnl |
CoRR
|
| 2022 | A | conf |
ICPC
|
| 2022 | J | jnl |
IEEE Trans. Knowl. Data Eng.
|
| 2022 | C | conf |
SCAM
|
| 2022 | J | jnl |
CoRR
|
| 2022 | B | conf |
TrustCom
|
| 2022 | J | jnl |
CoRR
|
| 2022 | B | conf |
VISSOFT
|
| 2021 | A | conf |
ICSME
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
ESORICS (1)
|
| 2020 | A* | conf |
ASE
|
| 2020 | J | jnl |
Inf. Softw. Technol.
|
| 2020 | A* | conf |
ICSE
|
| 2020 | J | jnl |
CoRR
|
| 2020 | — | conf |
Onward!
|
| 2020 | C | conf |
APSEC
|
| 2019 | B | conf |
VISSOFT
|
| 2019 | A | conf |
MSR
|
| 2019 | C | conf |
APSEC
|
| 2019 | J | jnl |
CoRR
|
| 2019 | — | conf |
TrustCom/BigDataSE
|
| 2019 | A | conf |
MSR
|
| 2018 | A | conf |
EASE
|
| 2018 | — | conf |
ASWEC
|
| 2018 | A | conf |
ICWS
|
| 2018 | J | jnl |
CoRR
|
| 2018 | B | conf |
APLAS
|
| 2018 | B | conf |
VISSOFT
|
| 2018 | J | jnl |
CoRR
|
| 2017 | J | jnl |
J. Object Technol.
|
| 2017 | J | jnl |
Dagstuhl Artifacts Ser.
|
| 2017 | A | conf |
ECOOP
|
| 2017 | J | jnl |
Dagstuhl Artifacts Ser.
|
| 2017 | A | conf |
ECOOP
|
| 2017 | C | conf |
APSEC
|
| 2017 | — | conf |
SOAP@PLDI
|
| 2017 | J | jnl |
J. Mach. Learn. Res.
|
| 2017 | J | jnl |
J. Object Technol.
|
| 2016 | C | ed. |
APSEC
|
| 2016 | — | conf |
FTfJP@ECOOP
|
| 2016 | B | conf |
ITiCSE
|
| 2016 | A | conf |
SANER
|
| 2016 | J | jnl |
Dagstuhl Artifacts Ser.
|
| 2016 | A | conf |
ECOOP
|
| 2016 | J | jnl |
Empir. Softw. Eng.
|
| 2015 | A | conf |
SANER
|
| 2015 | A | conf |
OOPSLA
|
| 2015 | J | jnl |
Inf. Softw. Technol.
|
| 2015 | — | conf |
ASWEC
|
| 2015 | — | conf |
ASWEC (2)
|
| 2014 | — | conf |
CSMR-WCRE
|
| 2014 | — | conf |
Australian Software Engineering Conference
|
| 2014 | — | conf |
EUROMICRO-SEAA
|
| 2014 | — | conf |
FCA4AI@ECAI
|
| 2014 | J | jnl |
CoRR
|
| 2013 | — | conf |
AAAI Workshop: Space, Time, and Ambient Intelligence
|
| 2013 | C | conf |
ACML
|
| 2013 | — | conf |
ICSM
|
| 2012 | — | conf |
RuleML
|
| 2012 | — | conf |
CSMR
|
| 2012 | A | conf |
SC
|
| 2012 | — | conf |
ACSC
|
| 2012 | Misc | conf |
ADC
|
| 2012 | C | conf |
ACML
|
| 2012 | — | conf |
SPLASH
|
| 2011 | J | jnl |
J. Res. Pract. Inf. Technol.
|
| 2011 | — | conf |
CBSE
|
| 2010 | C | conf |
APSEC
|
| 2010 | — | conf |
CBSE
|
| 2010 | — | conf |
QoSA
|
| 2010 | — | conf |
CBSE
|
| 2010 | J | jnl |
Datenschutz und Datensicherheit
|
| 2010 | J | jnl |
J. Ambient Intell. Smart Environ.
|
| 2010 | — | conf |
Australian Software Engineering Conference
|
| 2010 | C | conf |
APSEC
|
| 2010 | C | conf |
ICOST
|
| 2009 | J | jnl |
J. Object Technol.
|
| 2009 | C | conf |
ICIW
|
| 2009 | — | conf |
EDOCW
|
| 2009 | — | conf |
EDOCW
|
| 2008 | — | conf |
SOFTVIS
|
| 2008 | — | conf |
Australian Software Engineering Conference
|
| 2008 | B | conf |
WISE
|
| 2008 | Misc | conf |
APCCM
|
| 2008 | — | conf |
Australian Software Engineering Conference
|
| 2008 | — | conf |
KESE
|
| 2008 | J | jnl |
J. Syst. Softw.
|
| 2007 | B | conf |
ICECCS
|
| 2007 | — | conf |
RuleML
|
| 2007 | J | jnl |
J. Web Semant.
|
| 2007 | — | conf |
ASWEC
|
| 2005 | — | conf |
Australian Software Engineering Conference
|
| 2005 | — | conf |
RuleML
|
| 2005 | — | conf |
ISTA
|
| 2004 | B | conf |
KES
|
| 2003 | J | jnl |
Electron. Commer. Res. Appl.
|
| 1997 | — | — |