Jennifer Dworak

74 papers A* 2A 21B 3Misc 13Journal 12Unranked 23

Year	Rank	Type	Title / Venue / Authors
2025	B	`conf`	European Test Symposium Teams: an Anniversary Snapshot. ETS Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025	A	`conf`	LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern Generation for Zero Defect Automotive Designs. ITC Mohammed Zine E. Brahmi, Jennifer Dworak, Martina Perkovic, Megan Appel, Saidapet Ramesh, Ravi J. N, Ramanath Dharmavarm, Arun Kumar Anjaneyareddy, Chen He
2024	—	`conf`	Dual Use Circuitry for Early Failure Warning and Test. ISQED Alexander Coyle, Hui Jiang, Jennifer Dworak, Theodore W. Manikas, Kundan Nepal
2023	B	`conf`	Harvesting Wasted Clock Cycles for Efficient Online Testing. ETS Eslam Yassien, Yongjia Xu, Hui Jiang, Thach Nguyen, Jennifer Dworak, Theodore W. Manikas, Kundan Nepal
2023	J	`jnl`	Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. J. Electron. Test. Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas
2021	J	`jnl`	3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations. IEEE Trans. Emerg. Top. Comput. Soha Alhelaly, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Ping Gui, Alfred L. Crouch
2021	A	`conf`	Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits. ITC Yi Sun, Hui Jiang, Lakshmi Ramakrishnan, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, R. Iris Bahar
2020	J	`jnl`	A Novel Graph-Coloring-Based Solution for Low-Power Scan Shift. IEEE Des. Test Saurabh Gupta, Bonita Bhaskaran, Shantanu Sarangi, Ayub Abdollahian, Jennifer Dworak
2020	A	`conf`	Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks. ITC David Brauchler, Jennifer Dworak
2019	Misc	`conf`	A Novel Graph Coloring Based Solution for Low-Power Scan Shift. VTS Saurabh Gupta, Bonita Bhaskaran, Shantanu Sarangi, Ayub Abdollahian, Jennifer Dworak
2019	Misc	`conf`	Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. VTS Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song
2019	J	`jnl`	Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack. J. Electron. Test. Yi Sun, Fanchen Zhang, Hui Jiang, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar
2019	—	`conf`	Test Architecture for Fine Grained Capture Power Reduction. ICECS Yi Sun, Hui Jiang, Lakshmi Ramakrishnan, Matan Segal, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar
2018	—	`conf`	Can Soft Errors be Handled Securely? ISVLSI Senwen Kan, Jennifer Dworak
2018	Misc	`conf`	Efficient parallel testing: A configurable and scalable broadcast network design using IJTAG. VTS Saurabh Gupta, Jae Wu, Jennifer Dworak
2018	A	`conf`	IJTAG Integrity Checking with Chained Hashing. ITC Senwen Kan, Jennifer Dworak
2018	—	`conf`	One more time! Increasing fault detection with scan shift capture. NATW Hui Jiang, Fanchen Zhang, Yi Sun, Jennifer Dworak
2018	Misc	`conf`	Real-time monitoring of test fallout data to quickly identify tester and yield issues in a multi-site environment. VTS Qutaiba Khasawneh, Jennifer Dworak, Ping Gui, Benjamin Williams, Alan C. Elliott, Anand Muthaiah
2017	—	`conf`	Detecting a trojan die in 3D stacked integrated circuits. NATW Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch
2017	A	`conf`	Increasing IJTAG bandwidth and managing security through parallel locking-SIBs. ITC Saurabh Gupta, Al Crouch, Jennifer Dworak, Daniel Engels
2017	—	`conf`	Mitigating simple power analysis attacks on LSIB key logic. NATW Saurabh Gupta, Jennifer Dworak, Daniel Engels, Al Crouch
2017	—	`conf`	Systematic Test Generation for Secure Hardware Supported Virtualization. DASC/PiCom/DataCom/CyberSciTech Senwen Kan, Jennifer Dworak
2016	—	`conf`	A Case Study: Pre-Silicon SoC RAS Validation for NoC Server Processor. MTV Senwen Kan, Matthew Lam, Tyler Porter, Jennifer Dworak
2016	—	`conf`	Echeloned IJTAG data protection. AsianHOST Senwen Kan, Jennifer Dworak, James George Dunham
2016	A	`conf`	Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. ITC Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak
2016	—	`conf`	Using Existing Reconfigurable Logic in 3D Die Stacks for Test. NATW Fanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, Ping Gui, R. Iris Bahar, Al Crouch, John C. Potter
2015	Misc	`conf`	A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard. VTS Jennifer Dworak, Al Crouch
2015	A	`conf`	A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. ITC Tassanee Payakapan, Senwen Kan, Ken Pham, Kathy Yang, Jean-Francois Cote, Martin Keim, Jennifer Dworak
2015	—	`conf`	An Industrial Case Study: PaRent (Parallel & Concurrent) Testing for Complex Mixed-Signal Devices. NATW Jennifer Dworak, Ping Gui, Qutaiba Khasawneh
2015	—	`conf`	Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation. DFTS Senwen Kan, Marco Ottavi, Jennifer Dworak
2015	J	`jnl`	Repairing a 3-D Die-Stack Using Available Programmable Logic. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Kundan Nepal, Soha Alhelaly, Jennifer Dworak, R. Iris Bahar, Theodore W. Manikas, Ping Guikundan
2014	A	`conf`	Board security enhancement using new locking SIB-based architectures. ITC Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter
2014	A	`conf`	Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network. DATE Adam Zygmontowicz, Jennifer Dworak, Al Crouch, John C. Potter
2014	Misc	`conf`	Special session 4A: Elevator talks. VTS Jennifer Dworak
2014	—	`conf`	Triggering Trojans in SRAM circuits with X-propagation. DFT Senwen Kan, Jennifer Dworak
2014	—	`conf`	When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG. NATW Fanchen Zhang, Micah Thornton, Jennifer Dworak
2013	J	`jnl`	A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects. J. Electron. Test. Yiwen Shi, Jennifer Dworak
2013	—	`conf`	Built-in Self-Repair in a 3D die stack using programmable logic. DFTS Kundan Nepal, Xi Shen, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar
2013	A	`conf`	Don't forget to lock your SIB: Hiding instruments using P16871. ITC Jennifer Dworak, Al Crouch, John C. Potter, Adam Zygmontowicz, Micah Thornton
2013	J	`jnl`	FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System. IEEE Des. Test Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak
2013	Misc	`conf`	Special session 4B: Elevator talks. VTS Jennifer Dworak, Ronald Shawn Blanton, Masahiro Fujita, Kazumi Hatayama, Naghmeh Karimi, Michail Maniatakos, Antonis M. Paschalis, Adit D. Singh, Tian Xia
2013	—	`conf`	Ternary Logic Network Justification Using Transfer Matrices. ISMVL Mitchell A. Thornton, Jennifer Dworak
2012	J	`jnl`	NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak
2012	J	`jnl`	Using implications to choose tests through suspect fault identification. ACM Trans. Design Autom. Electr. Syst. Jennifer Dworak, Kundan Nepal, Nuno Alves, Yiwen Shi, Nicholas Imbriglia, R. Iris Bahar
2011	B	`conf`	Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. ETS Nuno Alves, Yiwen Shi, Nicholas Imbriglia, Jennifer Dworak, Kundan Nepal, R. Iris Bahar
2011	Misc	`conf`	Enhancing online error detection through area-efficient multi-site implications. VTS Nuno Alves, Yiwen Shi, Jennifer Dworak, R. Iris Bahar, Kundan Nepal
2011	A	`conf`	Partial state monitoring for fault detection estimation. ITC Yiwen Shi, Kantapon Kaewtip, Wan-Chan Hu, Jennifer Dworak
2010	J	`jnl`	A Cost Effective Approach for Online Error Detection Using Invariant Relationships. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Nuno Alves, Alison Buben, Kundan Nepal, Jennifer Dworak, R. Iris Bahar
2010	—	`conf`	Improving the testability and reliability of sequential circuits with invariant logic. ACM Great Lakes Symposium on VLSI Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar
2010	A	`conf`	NIM- a noise index model to estimate delay discrepancies between silicon and simulation. DATE Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel
2010	J	`jnl`	On Reducing Scan Shift Activity at RTL. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak
2010	Misc	`conf`	Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects. VTS Yiwen Shi, Wan-Chan Hu, Jennifer Dworak
2009	A	`conf`	Compacting test vector sets via strategic use of implications. ICCAD Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan Nepal
2009	A	`conf`	Detecting errors using multi-cycle invariance information. DATE Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar
2008	—	`conf`	Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization. DFT Yiwen Shi, Kellie DiPalma, Jennifer Dworak
2008	Misc	`conf`	Reducing Scan Shift Power at RTL. VTS Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak
2008	A	`conf`	Using Implications for Online Error Detection. ITC Kundan Nepal, Nuno Alves, Jennifer Dworak, R. Iris Bahar
2007	Misc	`conf`	An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting. VTS Jennifer Dworak
2007	A	`conf`	Which defects are most critical? optimizing test sets to minimize failures due to test escapes. ITC Jennifer Dworak
2006	A*	`conf`	A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors. DAC Vladimir Stojanovic, R. Iris Bahar, Jennifer Dworak, Richard Weiss
2005	—	`conf`	An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects. MTV Jennifer Dworak
2004	—	`conf`	A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects. DFT Jennifer Dworak, James Wingfield, M. Ray Mercer
2004	A	`conf`	Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. DATE Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer
2004	Misc	`conf`	Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. VTS Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer
2003	—	`conf`	Function-Based Dynamic Compaction and its Impact on Test Set Sizes. DFT James Wingfield, Jennifer Dworak, M. Ray Mercer
2002	A	`conf`	A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. DATE Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael R. Grimaila, M. Ray Mercer
2002	A	`conf`	Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
2002	A*	`conf`	Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
2002	—	`conf`	Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. DFT Jennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer
2001	J	`jnl`	Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Des. Test Comput. Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang
2000	A	`conf`	Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. ITC Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer
2000	—	`conf`	On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. Asian Test Symposium Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer
1999	A	`conf`	Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. ITC Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer
1999	Misc	`conf`	REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer