Jedrzej Solecki

14 papers A 4B 2Misc 1Journal 6Unranked 1
YearRankTypeTitle / Venue / Authors
2021 J jnl
Time and Area Optimized Testing of Automotive ICs.
IEEE Trans. Very Large Scale Integr. Syst.
Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2019 J jnl
Logic BIST With Capture-Per-Clock Hybrid Test Points.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada
2019 A conf
Test Time and Area Optimized BrST Scheme for Automotive ICs.
ITC
Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki
2018 Misc conf
Staggered ATPG with capture-per-cycle observation test points.
VTS
Yingdi Liu, Janusz Rajski, Sudhakar M. Reddy, Jedrzej Solecki, Jerzy Tyszer
2017 A conf
Full-scan LBIST with capture-per-cycle hybrid test points.
ITC
Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada
2017 J jnl
Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer
2017 J jnl
Trimodal Scan-Based Test Paradigm.
IEEE Trans. Very Large Scale Integr. Syst.
Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang
2015 A conf
A deterministic BIST scheme based on EDT-compressed test patterns.
ITC
Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer
2015 J jnl
Low-Power Programmable PRPG With Test Compression Capabilities.
IEEE Trans. Very Large Scale Integr. Syst.
Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2015 — conf
TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm.
ATS
Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang
2012 A conf
Low power programmable PRPG with enhanced fault coverage gradient.
ITC
Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski
2011 B conf
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction.
ETS
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2011 J jnl
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs.
J. Electron. Test.
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2010 B conf
Diagnosis of failing scan cells through orthogonal response compaction.
ETS
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer