Jean-Yves Delétage

23 papers C 1Journal 20Unranked 2
YearRankTypeTitle / Venue / Authors
2018 — conf
Characterization of external pressure effects on lithium-ion pouch cell.
ICIT
Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Guillaume Gager, Jean-Michel Vinassa
2018 J jnl
Creep measurement and choice of creep laws for BGA assemblies' reliability simulation.
Microelectron. Reliab.
S. Pin, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont
2018 J jnl
Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses.
Microelectron. Reliab.
Omar Chihani, L. Théolier, Alain Bensoussan, Jean-Yves Delétage, André Durier, Eric Woirgard
2018 J jnl
Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications.
Microelectron. Reliab.
Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Nicolas Chadourne, Jean-Michel Vinassa
2018 J jnl
Sequential combined thermal cycling and vibration test and simulation of printed circuit board.
Microelectron. Reliab.
Faical Arabi, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont
2018 — conf
Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs.
IRPS
Omar Chihani, Loic Théolier, Jean-Yves Delétage, Eric Woirgard, Alain Bensoussan, André Durier
2017 J jnl
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach.
Microelectron. Reliab.
S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont
2017 C conf
Performance quantification of latest generation Li-ion batteries in wide temperature range.
IECON
Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Guillaume Gager, Jean-Michel Vinassa
2016 J jnl
Chemical rate phenomenon approach applied to lithium battery capacity fade estimation.
Microelectron. Reliab.
Issam Baghdadi, Olivier Briat, Jean-Yves Delétage, Philippe Gyan, Jean-Michel Vinassa
2016 J jnl
Effects of salt spray test on lead-free solder alloy.
Microelectron. Reliab.
Alexandrine Guédon-Gracia, Hélène Frémont, Bernard Plano, Jean-Yves Delétage, Kirsten Weide-Zaage
2016 J jnl
Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices.
Microelectron. Reliab.
Faical Arabi, Loic Théolier, Donatien Martineau, Jean-Yves Delétage, M. Medina, Eric Woirgard
2013 J jnl
Conductive adhesive joint for extreme temperature applications.
Microelectron. Reliab.
J. B. Jullien, Hélène Frémont, Jean-Yves Delétage
2013 J jnl
Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach.
Microelectron. Reliab.
F. Baccar, Stephane Azzopardi, L. Théolier, K. El Boubkari, Jean-Yves Delétage, Eric Woirgard
2012 J jnl
A preliminary study on the thermal and mechanical performances of sintered nano-scale silver die-attach technology depending on the substrate metallization.
Microelectron. Reliab.
François Le Henaff, Stephane Azzopardi, Jean-Yves Delétage, Eric Woirgard, Serge Bontemps, Julien Joguet
2011 J jnl
Ageing monitoring of lithium-ion cell during power cycling tests.
Microelectron. Reliab.
Akram Eddahech, Olivier Briat, Hervé Henry, Jean-Yves Delétage, Eric Woirgard, Jean-Michel Vinassa
2011 J jnl
How supercapacitors reach end of life criteria during calendar life and power cycling tests.
Microelectron. Reliab.
Ramzi Chaari, Olivier Briat, Jean-Yves Delétage, Eric Woirgard, Jean-Michel Vinassa
2010 J jnl
Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling.
Microelectron. Reliab.
Olivier Briat, Jean-Michel Vinassa, Nicolas Bertrand, H. El Brouji, Jean-Yves Delétage, Eric Woirgard
2010 J jnl
Experimental electro-mechanical static characterization of IGBT bare die under controlled temperature.
Microelectron. Reliab.
Yassine Belmehdi, Stephane Azzopardi, Jean-Yves Delétage, Eric Woirgard
2009 J jnl
Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation.
Microelectron. Reliab.
Yassine Belmehdi, Stephane Azzopardi, A. Benmansour, Jean-Yves Delétage, Eric Woirgard
2004 J jnl
How to study delamination in plastic encapsulated devices.
Microelectron. Reliab.
Hélène Frémont, Jean-Yves Delétage, Kirsten Weide-Zaage, Yves Danto
2003 J jnl
Moisture diffusion in BCB resins used for MEMS packaging.
Microelectron. Reliab.
Angie Tetelin, Claude Pellet, Jean-Yves Delétage, B. Carbonne, Yves Danto
2003 J jnl
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
Microelectron. Reliab.
Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto
2003 J jnl
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.
Microelectron. Reliab.
Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard