Jean-Michel Karam

13 papers A* 1A 1Misc 2Journal 3Unranked 5
YearRankTypeTitle / Venue / Authors
2000 J jnl
Analog ALC crystal oscillators for high-temperature applications.
IEEE J. Solid State Circuits
Raúl Andrés Bianchi, Jean-Michel Karam, Bernard Courtois
1999 Misc conf
Design and Test of MEMs.
VLSI Design
Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
1999 — conf
Moving MEMS into Mainstream Applications: The MEMSCAP Solution.
VLSI
K. Liateni, D. Moulinier, B. Affour, A. Delpoux, Jean-Michel Karam
1998 A conf
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems.
ITC
A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois
1998 Misc conf
Testing MEMS.
VTS
Jean-Michel Karam, Marcelo Lubaszewski, R. D. Shawn Blanton, Andrew Richardson
1998 J jnl
Thermal Monitoring of Self-Checking Systems.
J. Electron. Test.
Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
1997 J jnl
CAD Tools for Bridging Microsystems and Foundries.
IEEE Des. Test Comput.
Jean-Michel Karam, Bernard Courtois, Hicham Boutamine
1997 A* conf
CAD and Foundries for Microsystems.
DAC
Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, Paul Drake, András Poppe, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
1997 — conf
Generation of the HDL-A-model of a micromembrane from its finite-element-description.
ED&TC
Klaus Hofmann, Manfred Glesner, Nicu Sebe, Anca Manuela Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois
1996 — conf
Applied design and analysis of microsystems.
ED&TC
Jean-Michel Karam, Bernard Courtois, András Poppe, Klaus Hofmann, Márta Rencz, Manfred Glesner, Vladimír Székely
1996 — conf
High level CAD melds microsystems with foundries.
ED&TC
Jean-Michel Karam, Bernard Courtois, M. Bauge
1996 — —
Méthodes et outils pour la conception et la fabrication des microsystèmes. (Methods and tools for the design and manufacturing of microsystems).
Jean-Michel Karam
1996 — conf
Thermal Monitoring Of Safety-Critical Integrated Systems.
Asian Test Symposium
Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois