Jean-Max Dutertre

110 papers A 5B 2C 29Journal 29Unranked 45
YearRankTypeTitle / Venue / Authors
2025 — conf
Betrayed by Light: How Photon Emission Microscopy Empowers Register Bit-Level Laser Attacks on Microcontrollers.
HOST
Hugo Perrin, Jean-Max Dutertre, Jean-Baptiste Rigaud
2025 — conf
Code Encryption for Confidentiality and Execution Integrity Down to Control Signals.
HOST
Théophile Gousselot, Jean-Max Dutertre, Olivier Potin, Jean-Baptiste Rigaud
2025 — conf
Laser Fault Injection on RO-Based PUFs Implemented on FPGA.
DFT
Aghiles Douadi, Elena-Ioana Vatajelu, Paolo Maistri, Jean-Max Dutertre, David Hély, Vincent Beroulle, Giorgio Di Natale
2025 A conf
Multi-Sensor Data Fusion for Enhanced Detection of Laser Fault Injection Attacks in Cryptographic Hardware: Practical Results.
DATE
Mohammad Ebrahimabadi, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi
2025 J jnl
Watch Out for the Lifespan: Evaluating Backdoor Attacks Against Federated Model Adaptation.
CoRR
Bastien Vuillod, Pierre-Alain Moëllic, Jean-Max Dutertre
2024 — conf
Analysis and Mitigation of Hybrid CMOS/MRAM DFF Vulnerabilities to Laser Fault Injection.
AsianHOST
Raphaël Comps, Jean-Baptiste Rigaud, Jean-Max Dutertre
2024 J jnl
DELFINES: Detecting Laser Fault Injection Attacks via Digital Sensors.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi
2024 C conf
EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design.
IOLTS
Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage
2024 J jnl
Switching Off your Device Does Not Protect Against Fault Attacks.
IACR Cryptol. ePrint Arch.
Paul Grandamme, Pierre-Antoine Tissot, Lilian Bossuet, Jean-Max Dutertre, Brice Colombier, Vincent Grosso
2024 J jnl
Switching Off your Device Does Not Protect Against Fault Attacks.
IACR Trans. Cryptogr. Hardw. Embed. Syst.
Paul Grandamme, Pierre-Antoine Tissot, Lilian Bossuet, Jean-Max Dutertre, Brice Colombier, Vincent Grosso
2024 J jnl
Tampering with the flash memory of microcontrollers: permanent fault injection via laser illumination during read operations.
J. Cryptogr. Eng.
Raphael Viera, Jean-Max Dutertre, Rodrigo Silva Lima, Matthieu Pommies, Anthony Bertrand
2024 — conf
When Data Shines - Leaking Data from Microcontrollers Through Photon Emission Analysis.
ASHES@CCS
Rodrigo Silva Lima, Raphael Viera, Jean-Max Dutertre, William Magrini, Matthieu Pommies, Anthony Bertrand
2023 — conf
A CCFI Verification Scheme Based on the RISC-V Trace Encoder.
COSADE
Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre
2023 C conf
A Tale of Two Models: Discussing the Timing and Sampling EM Fault Injection Models.
FDTC
Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage
2023 J jnl
Active Shielding Against Physical Attacks by Observation and Fault Injection: ChaXa.
J. Hardw. Syst. Secur.
Clément Gaine, Jean-Pierre Nikolovski, Driss Aboulkassimi, Jean-Max Dutertre
2023 — conf
CIFER: Code Integrity and control Flow verification for programs Executed on a RISC-V core.
HOST
Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre
2023 B conf
Evaluation of Parameter-Based Attacks Against Embedded Neural Networks with Laser Injection.
SAFECOMP
Mathieu Dumont, Kevin Hector, Pierre-Alain Moëllic, Jean-Max Dutertre, Simon Pontié
2023 J jnl
Evaluation of Parameter-based Attacks against Embedded Neural Networks with Laser Injection.
CoRR
Mathieu Dumont, Kevin Hector, Pierre-Alain Moëllic, Jean-Max Dutertre, Simon Pontié
2023 J jnl
Experimental EMFI detection on a RISC-V core using the Trace Verifier solution.
Microprocess. Microsystems
Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre
2023 — conf
Fault Injection and Safe-Error Attack for Extraction of Embedded Neural Network Models.
ESORICS Workshops (2)
Kevin Hector, Pierre-Alain Moëllic, Jean-Max Dutertre, Mathieu Dumont
2023 J jnl
Fault Injection and Safe-Error Attack for Extraction of Embedded Neural Network Models.
CoRR
Kevin Hector, Pierre-Alain Moëllic, Mathieu Dumont, Jean-Max Dutertre
2023 C conf
Fault Injection on Embedded Neural Networks: Impact of a Single Instruction Skip.
DSD
Clément Gaine, Pierre-Alain Moëllic, Olivier Potin, Jean-Max Dutertre
2023 J jnl
Fault Injection on Embedded Neural Networks: Impact of a Single Instruction Skip.
CoRR
Clément Gaine, Pierre-Alain Moëllic, Olivier Potin, Jean-Max Dutertre
2023 A conf
Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations.
DATE
Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage
2023 — conf
Lightweight Countermeasures Against Original Linear Code Extraction Attacks on a RISC-V Core.
HOST
Théophile Gousselot, Olivier Thomas, Jean-Max Dutertre, Olivier Potin, Jean-Baptiste Rigaud
2023 A conf
Security Evaluation of a Hybrid CMOS/MRAM Ascon Hardware Implementation.
DATE
Nathan Roussel, Olivier Potin, Jean-Max Dutertre, Jean-Baptiste Rigaud
2023 C conf
Software-Only Control-Flow Integrity Against Fault Injection Attacks.
DSD
François Bonnal, Vincent Dupaquis, Olivier Potin, Jean-Max Dutertre
2022 C conf
A CFI Verification System based on the RISC-V Instruction Trace Encoder.
DSD
Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre
2022 C conf
A Closer Look at Evaluating the Bit-Flip Attack Against Deep Neural Networks.
IOLTS
Kevin Hector, Pierre-Alain Moëllic, Mathieu Dumont, Jean-Max Dutertre
2022 J jnl
A Closer Look at Evaluating the Bit-Flip Attack Against Deep Neural Networks.
CoRR
Kevin Hector, Mathieu Dumont, Pierre-Alain Moëllic, Jean-Max Dutertre
2022 C conf
An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation.
IOLTS
William Souza da Cruz, Raphael Viera, Jean-Baptiste Rigaud, Guillaume Hubert, Jean-Max Dutertre
2022 — conf
CMOS/STT-MRAM Based Ascon LWC: a Power Efficient Hardware Implementation.
ICECS 2022
Nathan Roussel, Olivier Potin, Gregory di Pendina, Jean-Max Dutertre, Jean-Baptiste Rigaud
2022 — conf
Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors.
HOST
Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi
2022 — conf
Injecting Permanent Faults into the Flash Memory of a Microcontroller with Laser Illumination During Read Operations.
ASHES@CCS
Raphael Viera, Jean-Max Dutertre, Rodrigo Silva Lima
2022 J jnl
Photonic power firewalls.
J. Cryptogr. Eng.
Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Assia Tria
2021 — conf
An Overview of Laser Injection against Embedded Neural Network Models.
WF-IoT
Mathieu Dumont, Pierre-Alain Moëllic, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Rémi Bernhard
2021 J jnl
An Overview of Laser Injection against Embedded Neural Network Models.
CoRR
Mathieu Dumont, Pierre-Alain Moëllic, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Rémi Bernhard
2021 C conf
Analysis of a Laser-induced Instructions Replay Fault Model in a 32-bit Microcontroller.
DSD
Vanthanh Khuat, Jean-Max Dutertre, Jean-Luc Danger
2021 — conf
FaultLine: Software-Based Fault Injection on Memory Transfers.
HOST
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi
2021 — conf
Further Analysis of Laser-induced IR-drop.
ATS
William Souza da Cruz, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert
2021 C conf
Laser Fault Injection in a 32-bit Microcontroller: from the Flash Interface to the Execution Pipeline.
FDTC
Vanthanh Khuat, Jean-Luc Danger, Jean-Max Dutertre
2021 B conf
Luring Transferable Adversarial Perturbations for Deep Neural Networks.
IJCNN
Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre
2021 — conf
Permanent Laser Fault Injection into the Flash Memory of a Microcontroller.
NEWCAS
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Mathieu Dumont, Pierre-Alain Moëllic
2021 — conf
SideLine: How Delay-Lines (May) Leak Secrets from Your SoC.
COSADE
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi
2020 — conf
Electromagnetic Fault Injection as a New Forensic Approach for SoCs.
WIFS
Clément Gaine, Driss Aboulkassimi, Simon Pontié, Jean-Pierre Nikolovski, Jean-Max Dutertre
2020 — conf
Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell.
SBCCI
William Souza da Cruz, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert
2020 — conf
Experimental Analysis of the Electromagnetic Instruction Skip Fault Model.
DTIS
Alexandre Menu, Jean-Max Dutertre, Olivier Potin, Jean-Baptiste Rigaud, Jean-Luc Danger
2020 J jnl
Luring of Adversarial Perturbations.
CoRR
Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre
2020 J jnl
SideLine: How Delay-Lines (May) Leak Secrets from your SoC.
CoRR
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi
2020 J jnl
SideLine: How Delay-Lines (May) Leak Secrets from your SoC.
IACR Cryptol. ePrint Arch.
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi
2020 J jnl
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Raphael Andreoni Camponogara Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos
2020 C conf
Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation.
FDTC
Alexandre Menu, Jean-Max Dutertre, Jean-Baptiste Rigaud, Brice Colombier, Pierre-Alain Moëllic, Jean-Luc Danger
2019 C conf
Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM.
IOLTS
Mounia Kharbouche-Harrari, Romain Wacquez, Gregory di Pendina, Jean-Max Dutertre, Jérémy Postel-Pellerin, Driss Aboulkassimi, Jean-Michel Portal
2019 — conf
Experimental Analysis of the Laser-Induced Instruction Skip Fault Model.
NordSec
Jean-Max Dutertre, Timothée Riom, Olivier Potin, Jean-Baptiste Rigaud
2019 — conf
High-Speed Ring Oscillator based Sensors for Remote Side-Channel Attacks on FPGAs.
ReConFig
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi
2019 C conf
Impact of Low-Bitwidth Quantization on the Adversarial Robustness for Embedded Neural Networks.
CW
Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre
2019 J jnl
Impact of Low-bitwidth Quantization on the Adversarial Robustness for Embedded Neural Networks.
CoRR
Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre
2019 — conf
Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller.
HOST
Brice Colombier, Alexandre Menu, Jean-Max Dutertre, Pierre-Alain Moëllic, Jean-Baptiste Rigaud, Jean-Luc Danger
2019 C conf
Precise Spatio-Temporal Electromagnetic Fault Injections on Data Transfers.
FDTC
Alexandre Menu, Shivam Bhasin, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger
2019 C conf
Remote Side-Channel Attacks on Heterogeneous SoC.
CARDIS
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi, Francis Olivier
2018 J jnl
Assessing body built-in current sensors for detection of multiple transient faults.
Microelectron. Reliab.
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, Bruno Rouzeyre, Rodrigo Possamai Bastos
2018 C conf
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model.
FDTC
Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre
2018 J jnl
Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller.
IACR Cryptol. ePrint Arch.
Brice Colombier, Alexandre Menu, Jean-Max Dutertre, Pierre-Alain Moëllic, Jean-Baptiste Rigaud, Jean-Luc Danger
2018 — conf
Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits.
ISPD
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Philippe Maurine, Rodrigo Possamai Bastos
2018 C conf
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks.
IOLTS
Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre
2017 — conf
Importance of IR drops on the modeling of laser-induced transient faults.
SMACD
Raphael Andreoni Camponogara Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos
2017 J jnl
Method for evaluation of transient-fault detection techniques.
Microelectron. Reliab.
Raphael Andreoni Camponogara Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe Maurine, Rodrigo Iga Jadue
2017 C conf
Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation.
DSD
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Rodrigo Possamai Bastos, Philippe Maurine
2016 — conf
Body Biasing Injection Attacks in Practice.
CS2@HiPEAC
Noemie Beringuier-Boher, Marc Lacruche, David El-Baze, Jean-Max Dutertre, Jean-Baptiste Rigaud, Philippe Maurine
2016 J jnl
Frontside Versus Backside Laser Injection: A Comparative Study.
ACM J. Emerg. Technol. Comput. Syst.
Stephan De Castro, Jean-Max Dutertre, Bruno Rouzeyre, Giorgio Di Natale, Marie-Lise Flottes
2016 A conf
On the use of Forward Body Biasing to decrease the repeatability of laser-induced faults.
DATE
Marc Lacruche, Noemie Beringuier-Boher, Jean-Max Dutertre, Jean-Baptiste Rigaud, Edith Kussener
2016 — conf
Photonic Power Firewalls.
The New Codebreakers
Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Assia Tria
2015 — conf
Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.
IRPS
Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre
2015 J jnl
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation.
Microelectron. Reliab.
Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos
2015 — conf
Evidence of an information leakage between logically independent blocks.
CS2@HiPEAC
Loïc Zussa, Ingrid Exurville, Jean-Max Dutertre, Jean-Baptiste Rigaud, Bruno Robisson, Assia Tria, Jessy Clédière
2015 C conf
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents.
IOLTS
Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
2015 — conf
Figure of Merits of 28nm Si Technologies for Implementing Laser Attack Resistant Security Dedicated Circuits.
ISVLSI
Stephan De Castro, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Jean-Max Dutertre
2015 — conf
Influence of triple-well technology on laser fault injection and laser sensor efficiency.
DFTS
Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre
2015 C conf
Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses.
IOLTS
Marc Lacruche, Nicolas Borrel, Clement Champeix, Cyril Roscian, Alexandre Sarafianos, Jean-Baptiste Rigaud, Jean-Max Dutertre, Edith Kussener
2015 — conf
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology.
DFTS
Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
2014 — conf
Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter.
HOST
Loïc Zussa, Jean-Max Dutertre, Jessy Clédière, Bruno Robisson
2014 A conf
Efficiency of a glitch detector against electromagnetic fault injection.
DATE
Loïc Zussa, Amine Dehbaoui, Karim Tobich, Jean-Max Dutertre, Philippe Maurine, Ludovic Guillaume-Sage, Jessy Clédière, Assia Tria
2014 C conf
Electromagnetic analysis and fault injection onto secure circuits.
VLSI-SoC
Paolo Maistri, Régis Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu Lisart
2014 C conf
Evidence of a Larger EM-Induced Fault Model.
CARDIS
Sébastien Ordas, Ludovic Guillaume-Sage, Karim Tobich, Jean-Max Dutertre, Philippe Maurine
2014 J jnl
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.
Microelectron. Reliab.
Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos
2014 — conf
Laser attacks on integrated circuits: From CMOS to FD-SOI.
DTIS
Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale
2014 — conf
Laser-Induced Fault Effects in Security-Dedicated Circuits.
VLSI-SoC (Selected Papers)
Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert
2014 C conf
Laser-induced fault effects in security-dedicated circuits.
VLSI-SoC
Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier
2013 — conf
A bulk built-in sensor for detection of fault attacks.
HOST
Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre
2013 — conf
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults.
PATMOS
Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre
2013 — conf
Differential analysis of Round-Reduced AES faulty ciphertexts.
DFTS
Amir-Pasha Mirbaha, Jean-Max Dutertre, Assia Tria
2013 J jnl
Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell.
Microelectron. Reliab.
Alexandre Sarafianos, Cyril Roscian, Jean-Max Dutertre, Mathieu Lisart, Assia Tria
2013 — conf
Electromagnetic Glitch on the AES Round Counter.
COSADE
Amine Dehbaoui, Amir-Pasha Mirbaha, Nicolas Moro, Jean-Max Dutertre, Assia Tria
2013 C conf
Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells.
FDTC
Cyril Roscian, Alexandre Sarafianos, Jean-Max Dutertre, Assia Tria
2013 — conf
Frontside laser fault injection on cryptosystems - Application to the AES' last round -.
HOST
Cyril Roscian, Jean-Max Dutertre, Assia Tria
2013 C conf
Power supply glitch induced faults on FPGA: An in-depth analysis of the injection mechanism.
IOLTS
Loïc Zussa, Jean-Max Dutertre, Jessy Clédière, Assia Tria
2013 — conf
Practical measurements of data path delays for IP authentication & integrity verification.
ReCoSoC
Ingrid Exurville, Jacques J. A. Fournier, Jean-Max Dutertre, Bruno Robisson, Assia Tria
2013 — conf
Robustness improvement of an SRAM cell against laser-induced fault injection.
DFTS
Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria
2013 J jnl
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection.
Microelectron. Reliab.
Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale
2012 C conf
A DFA on AES Based on the Entropy of Error Distributions.
FDTC
Ronan Lashermes, Guillaume Reymond, Jean-Max Dutertre, Jacques J. A. Fournier, Bruno Robisson, Assia Tria
2012 J jnl
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.
Microelectron. Reliab.
Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis
2012 C conf
Electromagnetic Transient Faults Injection on a Hardware and a Software Implementations of AES.
FDTC
Amine Dehbaoui, Jean-Max Dutertre, Bruno Robisson, Assia Tria
2012 — conf
Fault Round Modification Analysis of the advanced encryption standard.
HOST
Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Anne-Lise Ribotta, Assia Tria, Thierry Vaschalde
2012 J jnl
Injection of transient faults using electromagnetic pulses -Practical results on a cryptographic system-.
IACR Cryptol. ePrint Arch.
Amine Dehbaoui, Jean-Max Dutertre, Bruno Robisson, P. Orsatelli, Philippe Maurine, Assia Tria
2011 — conf
A side-channel and fault-attack resistant AES circuit working on duplicated complemented values.
ISSCC
Marion Doulcier-Verdier, Jean-Max Dutertre, Jacques J. A. Fournier, Jean-Baptiste Rigaud, Bruno Robisson, Assia Tria
2011 J jnl
Design and characterisation of an AES chip embedding countermeasures.
Int. J. Intell. Eng. Informatics
Jacques J. A. Fournier, Jean-Baptiste Rigaud, Sylvain Bouquet, Bruno Robisson, Assia Tria, Jean-Max Dutertre, Michel Agoyan
2010 — conf
Experimental Fault Injection based on the Prototyping of an AES Cryptosystem.
ReCoSoC
Jean-Baptiste Rigaud, Jean-Max Dutertre, Michel Agoyan, Bruno Robisson, Assia Tria
2010 C conf
How to flip a bit?
IOLTS
Michel Agoyan, Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Anne-Lise Ribotta, Assia Tria
2010 C conf
When Clocks Fail: On Critical Paths and Clock Faults.
CARDIS
Michel Agoyan, Jean-Max Dutertre, David Naccache, Bruno Robisson, Assia Tria
2001 C conf
Integration of Robustness in the Design of a Cell.
VLSI-SOC
Jean-Max Dutertre, F. M. Roche, Guy Cathébras