Jean-Marc Gallière

25 papers A 1B 1C 2Misc 1Journal 5Unranked 15
YearRankTypeTitle / Venue / Authors
2025 J jnl
Cost-Effective Analytical Models of Resistive Opens Defects in FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst.
Gustavo Aguirre, Freddy Forero, Víctor H. Champac, Michel Renovell, Florence Azaïs, Mariane Comte, Jean-Marc Gallière
2023 C conf
A better practice for Body Biasing Injection.
FDTC
Geoffrey Chancel, Jean-Marc Gallière, Philippe Maurine
2021 — conf
Iterative Method for Performance Prediction Improvement of Integrated Circuits.
DCIS
Gwenael Chaillou, Philippe Maurine, Jean-Marc Gallière, Nadine Azémard
2019 — conf
A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells.
LATS
Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac
2019 J jnl
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies.
J. Electron. Test.
Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell
2018 — conf
Combined Analysis of Supply Voltage and Body-Bias Voltage for Energy Management.
PATMOS
Rida Kheirallah, Jean-Marc Gallière, Nadine Azémard, Gilles R. Ducharme
2018 J jnl
Detectability Challenges of Bridge Defects in FinFET Based Logic Cells.
J. Electron. Test.
Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac
2018 C conf
Exploiting Phase Information in Thermal Scans for Stealthy Trojan Detection.
DSD
Maxime Cozzi, Jean-Marc Gallière, Philippe Maurine
2018 — conf
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies.
LATS
Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell
2018 — conf
Thermal Scans for Detecting Hardware Trojans.
COSADE
Maxime Cozzi, Jean-Marc Gallière, Philippe Maurine
2017 — conf
Analysis of short defects in FinFET based logic cells.
LATS
Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac
2017 — conf
Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology.
ISVLSI
Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh
2017 B conf
Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions.
ETS
Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh
2017 J jnl
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies.
J. Electron. Test.
Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell
2016 — conf
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect.
LATS
Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell
2016 — conf
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations.
ISVLSI
Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell
2014 J jnl
Testing for gate oxide short defects using the detectability interval paradigm.
it Inf. Technol.
Jean-Marc Gallière, Florence Azaïs, Mariane Comte, Michel Renovell
2013 — conf
A toolkit to demystify CMOS Active Pixel Sensors.
MSE
Jean-Marc Gallière, Jerome Boch
2011 — conf
Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench.
LATW
Luigi Dilillo, Paolo Rech, Jean-Marc Gallière, Patrick Girard, Frederic Wrobel, Frédéric Saigné
2011 — conf
Versatile march test generator for hands-on memory testing laboratory.
MSE
Jean-Marc Gallière, Luigi Dilillo
2010 A conf
A roaming memory test bench for detecting particle induced SEUs.
ITC
Jean-Marc Gallière, Paolo Rech, Patrick Girard, Luigi Dilillo
2009 — conf
A mixed TCAD/Electrical simulation laboratory to open up the microelectronics teaching.
MSE
Jean-Marc Gallière, Jerome Boch
2008 — conf
A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric Transducers.
BMAS
Jean-Marc Gallière, Philippe Papet, Laurent Latorre
2007 — conf
Stream Manager, Easy CAD Tools Switching in Academic Context.
MSE
Jean-Marc Gallière, Guy Cathébras
2005 Misc conf
Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies.
VTS
Ilia Polian, Sandip Kundu, Jean-Marc Gallière, Piet Engelke, Michel Renovell, Bernd Becker